Yuji Akishiba

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical-scanning-height measuring device
- Patent number 10,415,956
- Issue date Sep 17, 2019
- Keyence Corporation
- Yuji Akishiba
- G01 - MEASURING TESTING
Information Patent Grant
Optical-scanning-height measuring device
- Patent number 10,107,998
- Issue date Oct 23, 2018
- Keyence Corporation
- Yuji Akishiba
- G02 - OPTICS
Information Patent Grant
Shape measuring device
- Patent number 10,066,932
- Issue date Sep 4, 2018
- Keyence Corporation
- Yuji Akishiba
- G01 - MEASURING TESTING
Information Patent Grant
Optical displacement gage
- Patent number 8,102,537
- Issue date Jan 24, 2012
- Keyence Corporation
- Yuji Akishiba
- G01 - MEASURING TESTING
Information Patent Grant
Displacement gauge and displacement measuring method
- Patent number 7,242,485
- Issue date Jul 10, 2007
- Keyence Corporation
- Yuji Akishiba
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact type profile measuring apparatus
- Patent number 6,700,671
- Issue date Mar 2, 2004
- Keyence Corporation
- Yuji Akishiba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical-Scanning-Height Measuring Device
- Publication number 20180180403
- Publication date Jun 28, 2018
- KEYENCE CORPORATION
- Yuji Akishiba
- G01 - MEASURING TESTING
Information Patent Application
Optical-Scanning-Height Measuring Device
- Publication number 20180180863
- Publication date Jun 28, 2018
- KEYENCE CORPORATION
- Yuji Akishiba
- G02 - OPTICS
Information Patent Application
Shape Measuring Device
- Publication number 20180100732
- Publication date Apr 12, 2018
- KEYENCE CORPORATION
- Yuji Akishiba
- G01 - MEASURING TESTING
Information Patent Application
Optical Displacement Gage
- Publication number 20100123898
- Publication date May 20, 2010
- KEYENCE CORPORATION
- Yuji Akishiba
- G01 - MEASURING TESTING
Information Patent Application
Displacement gauge and displacement measuring method
- Publication number 20050030553
- Publication date Feb 10, 2005
- Yuji Akishiba
- G02 - OPTICS
Information Patent Application
Non-contact type profile measuring apparatus
- Publication number 20020041381
- Publication date Apr 11, 2002
- Yuji Akishiba
- G01 - MEASURING TESTING