Yuji Ebiike

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Silicon carbide semiconductor device, power converter, and method o...
- Patent number 11,984,492
- Issue date May 14, 2024
- Mitsubishi Electric Corporation
- Yuji Ebiike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor test apparatus, semiconductor device test method, and...
- Patent number 11,380,596
- Issue date Jul 5, 2022
- Mitsubishi Electric Corporation
- Yuji Ebiike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device and inspection method
- Patent number 10,802,047
- Issue date Oct 13, 2020
- Mitsubishi Electric Corporation
- Naoto Kaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 10,276,711
- Issue date Apr 30, 2019
- Mitsubishi Electric Corporation
- Yuji Ebiike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon carbide semiconductor device and manufacturing method therefor
- Patent number 10,164,083
- Issue date Dec 25, 2018
- Mitsubishi Electric Corporation
- Yuji Ebiike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon carbide semiconductor device
- Patent number 9,972,676
- Issue date May 15, 2018
- Mitsubishi Electric Corporation
- Rina Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,190,468
- Issue date Nov 17, 2015
- Mitsubishi Electric Corporation
- Shiro Hino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,093,361
- Issue date Jul 28, 2015
- Mitsubishi Electric Corporation
- Shiro Hino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 9,059,086
- Issue date Jun 16, 2015
- Mitsubishi Electric Corporation
- Yuji Ebiike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 8,785,931
- Issue date Jul 22, 2014
- Mitsubishi Electric Corporation
- Shinichi Kinouchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240322022
- Publication date Sep 26, 2024
- Mitsubishi Electric Corporation
- Yuji EBIIKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240113208
- Publication date Apr 4, 2024
- Mitsubishi Electric Corporation
- Kohei SAKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR APPARATUS
- Publication number 20230387278
- Publication date Nov 30, 2023
- Mitsubishi Electric Corporation
- Yuji EBIIKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE, POWER CONVERTER, AND METHOD O...
- Publication number 20220254904
- Publication date Aug 11, 2022
- Mitsubishi Electric Corporation
- Yuji EBIIKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR TEST APPARATUS, SEMICONDUCTOR DEVICE TEST METHOD, AND...
- Publication number 20210098314
- Publication date Apr 1, 2021
- Mitsubishi Electric Corporation
- Yuji EBIIKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20200141977
- Publication date May 7, 2020
- Mitsubishi Electric Corporation
- Naoto KAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE, POWER CONVERTER, AND METHOD O...
- Publication number 20190348524
- Publication date Nov 14, 2019
- Mitsubishi Electric Corporation
- Yuji EBIIKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20180308973
- Publication date Oct 25, 2018
- Mitsubishi Electric Corporation
- Yuji EBIIKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
- Publication number 20170301783
- Publication date Oct 19, 2017
- Mitsubishi Electric Corporation
- Yuji EBIIKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE
- Publication number 20160336391
- Publication date Nov 17, 2016
- MITSUBISHI ELECTRIC CORPORATION
- Rina TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20140299891
- Publication date Oct 9, 2014
- Mitsubishi Electric Corporation
- Shiro Hino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20140077232
- Publication date Mar 20, 2014
- Mitsubishi Electric Corporation
- Shiro Hino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20130288467
- Publication date Oct 31, 2013
- MITSUBISHI ELECTRIC CORPORATION
- Yuji Ebiike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20130153900
- Publication date Jun 20, 2013
- Mitsubishi Electric Corporation
- Shinichi Kinouchi
- G01 - MEASURING TESTING

Yuji Ebiike

Person

Patents Grantslast 30 patents

Silicon carbide semiconductor device, power converter, and method o...

Semiconductor test apparatus, semiconductor device test method, and...

Inspection device and inspection method

Semiconductor device and method of manufacturing the same

Silicon carbide semiconductor device and manufacturing method therefor

Silicon carbide semiconductor device

Semiconductor device

Semiconductor device

Method of manufacturing semiconductor device

Semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR APPARATUS

SILICON CARBIDE SEMICONDUCTOR DEVICE, POWER CONVERTER, AND METHOD O...

SEMICONDUCTOR TEST APPARATUS, SEMICONDUCTOR DEVICE TEST METHOD, AND...

INSPECTION DEVICE AND INSPECTION METHOD

SILICON CARBIDE SEMICONDUCTOR DEVICE, POWER CONVERTER, AND METHOD O...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SILICON CARBIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR

SILICON CARBIDE SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE