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Yuji Fujikawa
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Kure, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Digital micrometer
Patent number
11,821,724
Issue date
Nov 21, 2023
Mitutoyo Corporation
Koji Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Method for controlling small-sized measurement device
Patent number
10,996,043
Issue date
May 4, 2021
Mitutoyo Corporation
Yasuhiro Tsujimoto
G01 - MEASURING TESTING
Information
Patent Grant
External device for measuring instrument
Patent number
10,451,450
Issue date
Oct 22, 2019
Mitutoyo Corporation
Atsuya Niwano
G01 - MEASURING TESTING
Information
Patent Grant
Measuring instrument
Patent number
10,295,324
Issue date
May 21, 2019
Mitutoyo Corporation
Koji Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Digital comparator having a retractable anvil supported at one end...
Patent number
9,982,985
Issue date
May 29, 2018
Mitutoyo Corporation
Yuji Fujikawa
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Micrometer
Patent number
8,296,966
Issue date
Oct 30, 2012
Mitutoyo Corporation
Shuji Hayashida
G01 - MEASURING TESTING
Information
Patent Grant
Inside diameter measuring tool
Patent number
8,033,032
Issue date
Oct 11, 2011
Mitutoyo Corporation
Yuji Fujikawa
G01 - MEASURING TESTING
Information
Patent Grant
Digital displacement measuring instrument
Patent number
8,001,698
Issue date
Aug 23, 2011
Mitutoyo Corporation
Shuji Hayashida
G01 - MEASURING TESTING
Information
Patent Grant
Digital displacement measuring instrument
Patent number
7,877,894
Issue date
Feb 1, 2011
Mitutoyo Corporation
Shuji Hayashida
G01 - MEASURING TESTING
Information
Patent Grant
Micrometer head
Patent number
D614983
Issue date
May 4, 2010
Mitutoyo Corporation
Yuji Fujikawa
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Micrometer head
Patent number
D614054
Issue date
Apr 20, 2010
Mitutoyo Corporation
Yuji Fujikawa
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Micrometer
Patent number
D584177
Issue date
Jan 6, 2009
Mitutoyo Corporation
Shigeru Ohtani
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Measurement instrument
Patent number
7,321,231
Issue date
Jan 22, 2008
Mitutoyo Corporation
Shuuji Hayashida
G01 - MEASURING TESTING
Information
Patent Grant
Measuring instrument
Patent number
7,043,852
Issue date
May 16, 2006
Mitutoyo Corporation
Shuuji Hayashida
G01 - MEASURING TESTING
Information
Patent Grant
Digital displacement measuring instrument
Patent number
7,020,979
Issue date
Apr 4, 2006
Mitutoyo Corporation
Shuuji Hayashida
G01 - MEASURING TESTING
Information
Patent Grant
Rotary movement converting mechanism and measuring instrument
Patent number
6,915,591
Issue date
Jul 12, 2005
Mitutoyo Corporation
Shuuji Hayashida
G01 - MEASURING TESTING
Information
Patent Grant
Comparator
Patent number
6,505,414
Issue date
Jan 14, 2003
Mitutoyo Corporation
Yuji Fujikawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DIGITAL MICROMETER
Publication number
20210140751
Publication date
May 13, 2021
MITUTOYO CORPORATION
Koji Matsumoto
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTROLLING SMALL-SIZED MEASUREMENT DEVICE
Publication number
20190323813
Publication date
Oct 24, 2019
Mitutoyo Corporation
Yasuhiro TSUJIMOTO
G01 - MEASURING TESTING
Information
Patent Application
EXTERNAL DEVICE FOR MEASURING INSTRUMENT
Publication number
20180052017
Publication date
Feb 22, 2018
Mitutoyo Corporation
Atsuya NIWANO
G01 - MEASURING TESTING
Information
Patent Application
MEASURING INSTRUMENT
Publication number
20170356731
Publication date
Dec 14, 2017
Mitutoyo Corporation
Koji MATSUMOTO
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL COMPARATOR
Publication number
20150328738
Publication date
Nov 19, 2015
Mitutoyo Corporation
Yuji FUJIKAWA
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
MICROMETER
Publication number
20110247231
Publication date
Oct 13, 2011
Mitutoyo Corporation
Shuji Hayashida
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL DISPLACEMENT MEASURING INSTRUMENT
Publication number
20100024237
Publication date
Feb 4, 2010
Mitutoyo Corporation
Shuji Hayashida
G01 - MEASURING TESTING
Information
Patent Application
INSIDE DIAMETER MEASURING TOOL
Publication number
20100005676
Publication date
Jan 14, 2010
Mitutoyo Corporation
Yuji Fujikawa
G01 - MEASURING TESTING
Information
Patent Application
Digital displacement measuring instrument
Publication number
20090282689
Publication date
Nov 19, 2009
Mitutoyo Corporation
Shuji Hayashida
G01 - MEASURING TESTING
Information
Patent Application
Measurement instrument
Publication number
20070018658
Publication date
Jan 25, 2007
Mitutoyo Corporation
Shuuji Hayashida
G01 - MEASURING TESTING
Information
Patent Application
Measuring instrument
Publication number
20050274034
Publication date
Dec 15, 2005
Mitutoyo Corporation
Suuji Hayashida
G01 - MEASURING TESTING
Information
Patent Application
Digital displacement measuring instrument
Publication number
20040250439
Publication date
Dec 16, 2004
Mitutoyo Corporation
Shuuji Hayashida
G01 - MEASURING TESTING
Information
Patent Application
Rotary movement converting mechanism and measuring instrument
Publication number
20040118004
Publication date
Jun 24, 2004
Mitutoyo Corporation
Shuuji Hayashida
G01 - MEASURING TESTING
Information
Patent Application
Comparator
Publication number
20010052191
Publication date
Dec 20, 2001
Mitutoyo Corporation
Yuji Fujikawa
G01 - MEASURING TESTING