Yuji Fujikawa

Person

  • Kure, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Digital micrometer

    • Patent number 11,821,724
    • Issue date Nov 21, 2023
    • Mitutoyo Corporation
    • Koji Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method for controlling small-sized measurement device

    • Patent number 10,996,043
    • Issue date May 4, 2021
    • Mitutoyo Corporation
    • Yasuhiro Tsujimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    External device for measuring instrument

    • Patent number 10,451,450
    • Issue date Oct 22, 2019
    • Mitutoyo Corporation
    • Atsuya Niwano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring instrument

    • Patent number 10,295,324
    • Issue date May 21, 2019
    • Mitutoyo Corporation
    • Koji Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Digital comparator having a retractable anvil supported at one end...

    • Patent number 9,982,985
    • Issue date May 29, 2018
    • Mitutoyo Corporation
    • Yuji Fujikawa
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Micrometer

    • Patent number 8,296,966
    • Issue date Oct 30, 2012
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Inside diameter measuring tool

    • Patent number 8,033,032
    • Issue date Oct 11, 2011
    • Mitutoyo Corporation
    • Yuji Fujikawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Digital displacement measuring instrument

    • Patent number 8,001,698
    • Issue date Aug 23, 2011
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Digital displacement measuring instrument

    • Patent number 7,877,894
    • Issue date Feb 1, 2011
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Micrometer head

    • Patent number D614983
    • Issue date May 4, 2010
    • Mitutoyo Corporation
    • Yuji Fujikawa
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Micrometer head

    • Patent number D614054
    • Issue date Apr 20, 2010
    • Mitutoyo Corporation
    • Yuji Fujikawa
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Micrometer

    • Patent number D584177
    • Issue date Jan 6, 2009
    • Mitutoyo Corporation
    • Shigeru Ohtani
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Measurement instrument

    • Patent number 7,321,231
    • Issue date Jan 22, 2008
    • Mitutoyo Corporation
    • Shuuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring instrument

    • Patent number 7,043,852
    • Issue date May 16, 2006
    • Mitutoyo Corporation
    • Shuuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Digital displacement measuring instrument

    • Patent number 7,020,979
    • Issue date Apr 4, 2006
    • Mitutoyo Corporation
    • Shuuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Rotary movement converting mechanism and measuring instrument

    • Patent number 6,915,591
    • Issue date Jul 12, 2005
    • Mitutoyo Corporation
    • Shuuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Comparator

    • Patent number 6,505,414
    • Issue date Jan 14, 2003
    • Mitutoyo Corporation
    • Yuji Fujikawa
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    DIGITAL MICROMETER

    • Publication number 20210140751
    • Publication date May 13, 2021
    • MITUTOYO CORPORATION
    • Koji Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD FOR CONTROLLING SMALL-SIZED MEASUREMENT DEVICE

    • Publication number 20190323813
    • Publication date Oct 24, 2019
    • Mitutoyo Corporation
    • Yasuhiro TSUJIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    EXTERNAL DEVICE FOR MEASURING INSTRUMENT

    • Publication number 20180052017
    • Publication date Feb 22, 2018
    • Mitutoyo Corporation
    • Atsuya NIWANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASURING INSTRUMENT

    • Publication number 20170356731
    • Publication date Dec 14, 2017
    • Mitutoyo Corporation
    • Koji MATSUMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    DIGITAL COMPARATOR

    • Publication number 20150328738
    • Publication date Nov 19, 2015
    • Mitutoyo Corporation
    • Yuji FUJIKAWA
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    MICROMETER

    • Publication number 20110247231
    • Publication date Oct 13, 2011
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Application

    DIGITAL DISPLACEMENT MEASURING INSTRUMENT

    • Publication number 20100024237
    • Publication date Feb 4, 2010
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Application

    INSIDE DIAMETER MEASURING TOOL

    • Publication number 20100005676
    • Publication date Jan 14, 2010
    • Mitutoyo Corporation
    • Yuji Fujikawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    Digital displacement measuring instrument

    • Publication number 20090282689
    • Publication date Nov 19, 2009
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Measurement instrument

    • Publication number 20070018658
    • Publication date Jan 25, 2007
    • Mitutoyo Corporation
    • Shuuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Measuring instrument

    • Publication number 20050274034
    • Publication date Dec 15, 2005
    • Mitutoyo Corporation
    • Suuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Digital displacement measuring instrument

    • Publication number 20040250439
    • Publication date Dec 16, 2004
    • Mitutoyo Corporation
    • Shuuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Rotary movement converting mechanism and measuring instrument

    • Publication number 20040118004
    • Publication date Jun 24, 2004
    • Mitutoyo Corporation
    • Shuuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Comparator

    • Publication number 20010052191
    • Publication date Dec 20, 2001
    • Mitutoyo Corporation
    • Yuji Fujikawa
    • G01 - MEASURING TESTING