Yuji Kohno

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for image processing
- Patent number 11,508,550
- Issue date Nov 22, 2022
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of acquiring dark-field image
- Patent number 11,462,384
- Issue date Oct 4, 2022
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image acquisition method and electron microscope
- Patent number 11,456,151
- Issue date Sep 27, 2022
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deflector and charged particle beam system
- Patent number 11,251,013
- Issue date Feb 15, 2022
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of controlling transmission electron microscope and transmis...
- Patent number 11,251,016
- Issue date Feb 15, 2022
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cold cathode field-emission electron gun, adjustment method for col...
- Patent number 11,031,208
- Issue date Jun 8, 2021
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of aberration measurement and electron microscope
- Patent number 10,886,099
- Issue date Jan 5, 2021
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration measurement method and electron microscope
- Patent number 10,840,058
- Issue date Nov 17, 2020
- Jeol Ltd.
- Yuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method and electron microscope
- Patent number 10,714,308
- Issue date Jul 14, 2020
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens and transmission electron microscope
- Patent number 10,224,173
- Issue date Mar 5, 2019
- Jeol Ltd.
- Tatsuo Naruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and method of aberration measurement
- Patent number 10,014,153
- Issue date Jul 3, 2018
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and measurement method
- Patent number 9,859,095
- Issue date Jan 2, 2018
- The University of Tokyo
- Naoya Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and method of measuring aberrations
- Patent number 9,779,911
- Issue date Oct 3, 2017
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement method and electron microscope
- Patent number 9,728,372
- Issue date Aug 8, 2017
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multipole lens and charged particle beam system
- Patent number 9,576,768
- Issue date Feb 21, 2017
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multipole lens, method of fabricating same, and charged particle be...
- Patent number 9,396,904
- Issue date Jul 19, 2016
- Jeol Ltd.
- Yuji Kohno
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Electron microscope and method of adjusting the same
- Patent number 8,859,964
- Issue date Oct 14, 2014
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method of Adjusting Charged Particle Optical System and Charged Par...
- Publication number 20240145211
- Publication date May 2, 2024
- JEOL Ltd.
- Shigeyuki Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Aberration Measurement Method
- Publication number 20230349839
- Publication date Nov 2, 2023
- JEOL Ltd.
- Hidetaka Sawada
- G01 - MEASURING TESTING
Information Patent Application
Electron Microscope and Image Acquisition Method
- Publication number 20230127255
- Publication date Apr 27, 2023
- JEOL Ltd.
- Kazunori Somehara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Image Acquisition Method and Electron Microscope
- Publication number 20220020561
- Publication date Jan 20, 2022
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Image Processing
- Publication number 20220018923
- Publication date Jan 20, 2022
- JEOL Ltd.
- Yuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Method of Acquiring Dark-Field Image
- Publication number 20210082663
- Publication date Mar 18, 2021
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Controlling Transmission Electron Microscope and Transmis...
- Publication number 20200312612
- Publication date Oct 1, 2020
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Deflector and Charged Particle Beam System
- Publication number 20200243297
- Publication date Jul 30, 2020
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Aberration Measurement and Electron Microscope
- Publication number 20190267210
- Publication date Aug 29, 2019
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cold Cathode Field-Emission Electron Gun, Cold Cathode Field-Emissi...
- Publication number 20190096626
- Publication date Mar 28, 2019
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement Method and Electron Microscope
- Publication number 20190088447
- Publication date Mar 21, 2019
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ABERRATION MEASUREMENT METHOD AND ELECTRON MICROSCOPE
- Publication number 20190066968
- Publication date Feb 28, 2019
- JEOL Ltd.
- Yuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Objective Lens and Transmission Electron Microscope
- Publication number 20180130633
- Publication date May 10, 2018
- JEOL Ltd.
- Tatsuo Naruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Method of Aberration Measurement
- Publication number 20170236684
- Publication date Aug 17, 2017
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Measurement Method
- Publication number 20170025248
- Publication date Jan 26, 2017
- THE UNIVERSITY OF TOKYO
- Naoya Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement Method and Electron Microscope
- Publication number 20160254118
- Publication date Sep 1, 2016
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multipole Lens and Charged Particle Beam System
- Publication number 20160225576
- Publication date Aug 4, 2016
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Method of Measuring Aberrations
- Publication number 20160225580
- Publication date Aug 4, 2016
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multipole Lens, Method of Fabricating Same, and Charged Particle Be...
- Publication number 20150287566
- Publication date Oct 8, 2015
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Method of Adjusting the Same
- Publication number 20130327938
- Publication date Dec 12, 2013
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Method and apparatus for image processing

Method of acquiring dark-field image

Image acquisition method and electron microscope

Deflector and charged particle beam system

Method of controlling transmission electron microscope and transmis...

Cold cathode field-emission electron gun, adjustment method for col...

Method of aberration measurement and electron microscope

Aberration measurement method and electron microscope

Measurement method and electron microscope

Objective lens and transmission electron microscope

Electron microscope and method of aberration measurement

Electron microscope and measurement method

Electron microscope and method of measuring aberrations

Measurement method and electron microscope

Multipole lens and charged particle beam system

Multipole lens, method of fabricating same, and charged particle be...

Electron microscope and method of adjusting the same

Patents Applicationslast 30 patents

Method of Adjusting Charged Particle Optical System and Charged Par...

Electron Microscope and Aberration Measurement Method

Electron Microscope and Image Acquisition Method

Image Acquisition Method and Electron Microscope

Method and Apparatus for Image Processing

Method of Acquiring Dark-Field Image

Method of Controlling Transmission Electron Microscope and Transmis...

Deflector and Charged Particle Beam System

Method of Aberration Measurement and Electron Microscope

Cold Cathode Field-Emission Electron Gun, Cold Cathode Field-Emissi...

Measurement Method and Electron Microscope

ABERRATION MEASUREMENT METHOD AND ELECTRON MICROSCOPE

Objective Lens and Transmission Electron Microscope

Electron Microscope and Method of Aberration Measurement

Electron Microscope and Measurement Method

Measurement Method and Electron Microscope

Multipole Lens and Charged Particle Beam System

Electron Microscope and Method of Measuring Aberrations

Multipole Lens, Method of Fabricating Same, and Charged Particle Be...

Electron Microscope and Method of Adjusting the Same