Yuji KUWANA

Person

  • Tokyo, JP

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    DRIVER CIRCUIT AND TEST APPARATUS

    • Publication number 20110050194
    • Publication date Mar 3, 2011
    • Advantest Corporation
    • Yuji KUWANA
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    DRIVER CIRCUIT

    • Publication number 20110043250
    • Publication date Feb 24, 2011
    • Advantest Corporation
    • Yuji KUWANA
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    TEST APPARATUS AND DRIVER CIRCUIT

    • Publication number 20100244880
    • Publication date Sep 30, 2010
    • Advantest Corporation
    • Yasuhiro Urabe
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST APPARATUS AND DRIVER CIRCUIT

    • Publication number 20100244884
    • Publication date Sep 30, 2010
    • Advantest Corporation
    • YASUHIRO URABE
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    Compensation circuit and test apparatus

    • Publication number 20100190448
    • Publication date Jul 29, 2010
    • Advantest Corporation
    • Yuji KUWANA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Temperature compensation circuit and testing apparatus

    • Publication number 20070176617
    • Publication date Aug 2, 2007
    • Advantest Corporation
    • Yuji Kuwana
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Frequency converter

    • Publication number 20070099590
    • Publication date May 3, 2007
    • Advantest Corporation
    • Hideyuki Okabe
    • H03 - BASIC ELECTRONIC CIRCUITRY