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Yuji KUWANA
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Compensation circuit and test apparatus
Patent number
8,531,187
Issue date
Sep 10, 2013
Advantest Corporation
Yuji Kuwana
G01 - MEASURING TESTING
Information
Patent Grant
Driver circuit
Patent number
8,410,817
Issue date
Apr 2, 2013
Advantest Corporation
Yuji Kuwana
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Driver circuit and test apparatus
Patent number
8,368,366
Issue date
Feb 5, 2013
Advantest Corporation
Yuji Kuwana
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Test apparatus and driver circuit
Patent number
8,013,626
Issue date
Sep 6, 2011
Advantest Corporation
Yasuhiro Urabe
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Test apparatus and driver circuit
Patent number
7,795,897
Issue date
Sep 14, 2010
Advantest Corporation
Yasuhiro Urabe
G01 - MEASURING TESTING
Information
Patent Grant
Temperature compensation circuit and testing apparatus
Patent number
7,342,407
Issue date
Mar 11, 2008
Advantest Corporation
Yuji Kuwana
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DRIVER CIRCUIT AND TEST APPARATUS
Publication number
20110050194
Publication date
Mar 3, 2011
Advantest Corporation
Yuji KUWANA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
DRIVER CIRCUIT
Publication number
20110043250
Publication date
Feb 24, 2011
Advantest Corporation
Yuji KUWANA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TEST APPARATUS AND DRIVER CIRCUIT
Publication number
20100244880
Publication date
Sep 30, 2010
Advantest Corporation
Yasuhiro Urabe
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS AND DRIVER CIRCUIT
Publication number
20100244884
Publication date
Sep 30, 2010
Advantest Corporation
YASUHIRO URABE
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Compensation circuit and test apparatus
Publication number
20100190448
Publication date
Jul 29, 2010
Advantest Corporation
Yuji KUWANA
G01 - MEASURING TESTING
Information
Patent Application
Temperature compensation circuit and testing apparatus
Publication number
20070176617
Publication date
Aug 2, 2007
Advantest Corporation
Yuji Kuwana
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Frequency converter
Publication number
20070099590
Publication date
May 3, 2007
Advantest Corporation
Hideyuki Okabe
H03 - BASIC ELECTRONIC CIRCUITRY