Yuji MARUYAMA

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method of testing semiconductor device
- Patent number 8,648,617
- Issue date Feb 11, 2014
- Fujitsu Semiconductor Limited
- Yuji Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Testing device for testing a semiconductor device
- Patent number 8,159,250
- Issue date Apr 17, 2012
- Fujitsu Semiconductor Limited
- Yuji Maruyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE
- Publication number 20110221466
- Publication date Sep 15, 2011
- FUJITSU SEMICONDUCTOR LIMITED
- Yuji MARUYAMA
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE OF SEMICONDUCTOR DEVICE
- Publication number 20090267630
- Publication date Oct 29, 2009
- Fujitsu Microelectronics Limited
- Yuji Maruyama
- G01 - MEASURING TESTING