Yuji Miyagi

Person

Aomori, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Chip stack device testing method, chip stack device rearranging uni...
- Patent number 9,097,761
- Issue date Aug 4, 2015
- Kabushiki Kaisha Nihon Micronics
- Katsuo Yasuta
- G01 - MEASURING TESTING
Information Patent Grant
Probe and electrical connecting apparatus using it
- Patent number 7,924,038
- Issue date Apr 12, 2011
- Kabushiki Kaisha Nihon Micronics
- Shinji Kuniyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly, method of producing it and electrical connecting ap...
- Patent number 7,667,472
- Issue date Feb 23, 2010
- Kabushiki Kaisha Nihon Micronics
- Kiyotoshi Miura
- G01 - MEASURING TESTING
Information Patent Grant
Probe for electrical test comprising a positioning mark and probe a...
- Patent number 7,602,200
- Issue date Oct 13, 2009
- Kabushiki Kaisha Nihon Micronics
- Yuji Miyagi
- G01 - MEASURING TESTING
Information Patent Grant
Probe board mounting apparatus
- Patent number 7,586,316
- Issue date Sep 8, 2009
- Kabushiki Kaisha Nihon Micronics
- Shinji Kuniyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus
- Patent number 7,525,329
- Issue date Apr 28, 2009
- Kabushiki Kaisha Nihon Micronics
- Yuji Miyagi
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus
- Patent number 7,468,610
- Issue date Dec 23, 2008
- Kabushiki Kaisha Nihon Micronics
- Yuji Miyagi
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing an electrical device
- Patent number 7,449,906
- Issue date Nov 11, 2008
- Kabushiki Kaisha Nihon Micronics
- Kiyotoshi Miura
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection device and wafer inspection method
- Patent number 6,498,504
- Issue date Dec 24, 2002
- NEC Corporation
- Yuji Miyagi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHIP STACK DEVICE TESTING METHOD, CHIP STACK DEVICE REARRANGING UNI...
- Publication number 20120126844
- Publication date May 24, 2012
- Kabushiki Kaisha Nihon Micronics
- Katsuo YASUTA
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND ELECTRICAL CONNECTING APPARATUS USING IT
- Publication number 20100219854
- Publication date Sep 2, 2010
- KABUSHIKI KAISHA NIHON MICRONICS
- Shinji Kuniyoshi
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY, METHOD OF PRODUCING IT AND ELECTRICAL CONNECTING AP...
- Publication number 20090058440
- Publication date Mar 5, 2009
- Kabushiki Kaisha Nihon Micronics
- Kiyotoshi Miura
- G01 - MEASURING TESTING
Information Patent Application
Probe for Electrical Test and Probe Assembly
- Publication number 20090009201
- Publication date Jan 8, 2009
- Kabushiki Kaisha Nihon Micronics
- Yuji Miyagi
- G01 - MEASURING TESTING
Information Patent Application
Electrical Connecting Apparatus
- Publication number 20080315905
- Publication date Dec 25, 2008
- Kabushiki Kaisha Nihon Mocronics
- Shinji Kuniyoshi
- G01 - MEASURING TESTING
Information Patent Application
CLEANING APPARATUS FOR A PROBE
- Publication number 20080280542
- Publication date Nov 13, 2008
- KABUSHIKI KAISHA NIHON MICRONICS
- Yuji Miyagi
- B24 - GRINDING POLISHING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20080197869
- Publication date Aug 21, 2008
- Kabushiki Kaisha Nihon Micronics
- Yuji MIYAGI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20080122466
- Publication date May 29, 2008
- Kabushiki Kaisha Nihon Micronics
- Yuji MIYAGI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20080122467
- Publication date May 29, 2008
- Kabushiki Kaisha Nihon Micronics
- Yuji MIYAGI
- G01 - MEASURING TESTING
Information Patent Application
Probe For Electric Test
- Publication number 20070216433
- Publication date Sep 20, 2007
- Kiyotoshi Miura
- G01 - MEASURING TESTING
Information Patent Application
Wafer inspection device and wafer inspection method
- Publication number 20020024355
- Publication date Feb 28, 2002
- NEC Corporation
- Masayoshi Suzuki
- G01 - MEASURING TESTING

Yuji Miyagi

Person

Patents Grantslast 30 patents

Chip stack device testing method, chip stack device rearranging uni...

Probe and electrical connecting apparatus using it

Probe assembly, method of producing it and electrical connecting ap...

Probe for electrical test comprising a positioning mark and probe a...

Probe board mounting apparatus

Electrical connecting apparatus

Electrical connecting apparatus

Probe for testing an electrical device

Wafer inspection device and wafer inspection method

Patents Applicationslast 30 patents

CHIP STACK DEVICE TESTING METHOD, CHIP STACK DEVICE REARRANGING UNI...

PROBE AND ELECTRICAL CONNECTING APPARATUS USING IT

PROBE ASSEMBLY, METHOD OF PRODUCING IT AND ELECTRICAL CONNECTING AP...

Probe for Electrical Test and Probe Assembly

Electrical Connecting Apparatus

CLEANING APPARATUS FOR A PROBE

ELECTRICAL CONNECTING APPARATUS

ELECTRICAL CONNECTING APPARATUS

ELECTRICAL CONNECTING APPARATUS

Probe For Electric Test

Wafer inspection device and wafer inspection method