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Yuji MIYATO
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Suita-shi, JP
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last 30 patents
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Patent Grant
Electric near-field probe, control system for same, and piezoelectr...
Patent number
9,891,338
Issue date
Feb 13, 2018
Osaka University
Hideo Akaba
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
ELECTRIC NEAR-FIELD PROBE, CONTROL SYSTEM FOR SAME, AND PIEZOELECTR...
Publication number
20160047932
Publication date
Feb 18, 2016
OSAKA UNIVERSITY
Hideo AKABA
G01 - MEASURING TESTING