Yuji Miyoshi

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection method and inspection apparatus
- Patent number 8,670,115
- Issue date Mar 11, 2014
- Hitachi High-Technologies Corporation
- Yuji Miyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection tool and surface inspection method
- Patent number 8,462,352
- Issue date Jun 11, 2013
- Hitachi High-Technologies Corporation
- Yuji Miyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection tool and surface inspection method
- Patent number 8,189,205
- Issue date May 29, 2012
- Hitachi High-Technologies Corporation
- Yuji Miyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection tool and surface inspection method
- Patent number 7,884,948
- Issue date Feb 8, 2011
- Hitachi High-Technologies Corporation
- Yuji Miyoshi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SURFACE INSPECTION TOOL AND SURFACE INSPECTION METHOD
- Publication number 20130258351
- Publication date Oct 3, 2013
- Hitachi High-Technologies Corporation
- Yuji Miyoshi
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION TOOL AND SURFACE INSPECTION METHOD
- Publication number 20120262723
- Publication date Oct 18, 2012
- Hitachi High-Technologies Corporation
- Yuji Miyoshi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20110255080
- Publication date Oct 20, 2011
- Hitachi High-Technologies Corporation
- Yuji Miyoshi
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION TOOL AND SURFACE INSPECTION METHOD
- Publication number 20110090512
- Publication date Apr 21, 2011
- Hitachi High-Technologies Corporation
- Yuji Miyoshi
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION TOOL AND SURFACE INSPECTION METHOD
- Publication number 20090185178
- Publication date Jul 23, 2009
- Hitachi High-Technologies Corporation
- Yuji Miyoshi
- G01 - MEASURING TESTING