Yuji Odan

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Hiroshima, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for inspecting electronic circuits
- Patent number 7,239,127
- Issue date Jul 3, 2007
- OHT Inc.
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting electronic circuits
- Patent number 6,967,498
- Issue date Nov 22, 2005
- OHT Inc.
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Grant
Electronic circuit inspection sensor and inspection system using same
- Patent number 6,933,740
- Issue date Aug 23, 2005
- OHT, Inc.
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Grant
Sensor probe for use in board inspection and manufacturing method t...
- Patent number 6,614,250
- Issue date Sep 2, 2003
- OHT Inc.
- Yuji Odan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for inspecting electronic circuits
- Publication number 20040027142
- Publication date Feb 12, 2004
- HOT INC,.
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting electronic circuits
- Publication number 20040027143
- Publication date Feb 12, 2004
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Application
Sensor probe for use in board inspection and manufacturing method t...
- Publication number 20040027146
- Publication date Feb 12, 2004
- OHT INC.
- Yuji Odan
- G01 - MEASURING TESTING