Yuji Shigesawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wafer inspection apparatus and semiconductor wafer in...
- Patent number 9,869,715
- Issue date Jan 16, 2018
- Tokyo Seimitsu Co., Ltd.
- Takashi Ishimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Prober
- Patent number 9,519,009
- Issue date Dec 13, 2016
- Tokyo Seimitsu Co., Ltd.
- Konosuke Murakami
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Wafer Inspection Apparatus And Semiconductor Wafer In...
- Publication number 20170010323
- Publication date Jan 12, 2017
- TOKYO SEIMITSU CO., LTD.
- Takashi ISHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
PROBER
- Publication number 20150137842
- Publication date May 21, 2015
- TOKYO SEIMITSU CO., LTD.
- Konosuke Murakami
- G01 - MEASURING TESTING