Yuji TAKEHARA

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Failure estimation apparatus and failure estimation method
- Patent number 10,365,320
- Issue date Jul 30, 2019
- Renesas Electronics Corporation
- Yuji Takehara
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor light-emitting device, lighting apparatus, and lighti...
- Patent number 10,267,469
- Issue date Apr 23, 2019
- Stanley Electric Co., Ltd.
- Mitsunori Harada
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Semiconductor device and fault detecting method
- Patent number 9,935,577
- Issue date Apr 3, 2018
- Renesas Electronics Corporation
- Katsutoshi Bito
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR LIGHT-EMITTING DEVICE, LIGHTING APPARATUS, AND LIGHTI...
- Publication number 20170210277
- Publication date Jul 27, 2017
- Stanley Electric Co., Ltd
- Mitsunori HARADA
- B60 - VEHICLES IN GENERAL
Information Patent Application
FAILURE ESTIMATION APPARATUS AND FAILURE ESTIMATION METHOD
- Publication number 20170023634
- Publication date Jan 26, 2017
- RENESAS ELECTRONICS CORPORATION
- Yuji TAKEHARA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND FAULT DETECTING METHOD
- Publication number 20170003337
- Publication date Jan 5, 2017
- RENESAS ELECTRONICS CORPORATION
- Katsutoshi BITO
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE REGULATOR, SEMICONDUCTOR DEVICE, AND DATA PROCESSING SYSTEM
- Publication number 20140032942
- Publication date Jan 30, 2014
- RENESAS ELECTRONICS CORPORATION
- Yuji TAKEHARA
- G06 - COMPUTING CALCULATING COUNTING