Yuji Wada

Person

Kamisato, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Fabrication method of semiconductor integrated circuit device
- Patent number 7,422,914
- Issue date Sep 9, 2008
- Renesas Technology Corp.
- Yuji Wada
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing a memory device in quasi-operating...
- Patent number 7,356,742
- Issue date Apr 8, 2008
- Renesas Technology Corp.
- Hideyuki Aoki
- G11 - INFORMATION STORAGE
Information Patent Grant
Fabrication method of semiconductor integrated circuit device
- Patent number 7,351,597
- Issue date Apr 1, 2008
- Renesas Technology Corp.
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication method of semiconductor integrated circuit device
- Patent number 7,306,957
- Issue date Dec 11, 2007
- Renesas Technology Corp.
- Yuji Wada
- G11 - INFORMATION STORAGE
Information Patent Grant
Fabrication method of semiconductor integrated circuit device
- Patent number 7,219,422
- Issue date May 22, 2007
- Renesas Technology Corp.
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 7,198,962
- Issue date Apr 3, 2007
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Packaging device for holding a plurality of semiconductor devices t...
- Patent number 6,864,568
- Issue date Mar 8, 2005
- Renesas Technology Corp.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication method of semiconductor integrated circuit device and i...
- Patent number 6,696,849
- Issue date Feb 24, 2004
- Renesas Technology Corporation
- Naoto Ban
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,566,150
- Issue date May 20, 2003
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing semiconductor device and apparatus usable therein
- Patent number 6,465,264
- Issue date Oct 15, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,455,335
- Issue date Sep 24, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Interface unit for a tester and method of connecting a tester with...
- Patent number 6,348,810
- Issue date Feb 19, 2002
- Hitachi Electronics Engineering Co., Ltd.
- Makoto Yanagawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,197,603
- Issue date Mar 6, 2001
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
IC testing apparatus and method
- Patent number 6,138,257
- Issue date Oct 24, 2000
- Hitachi Electronics Engineering Co., Ltd.
- Yuji Wada
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20080293167
- Publication date Nov 27, 2008
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20080070330
- Publication date Mar 20, 2008
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20070218572
- Publication date Sep 20, 2007
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for testing a memory device in quasi-operating...
- Publication number 20050193274
- Publication date Sep 1, 2005
- Hitachi, Ltd.
- Hideyuki Aoki
- G11 - INFORMATION STORAGE
Information Patent Application
Fabrication method of semiconductor integrated circuit device
- Publication number 20050153465
- Publication date Jul 14, 2005
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Application
Fabrication method of semiconductor integrated circuit device
- Publication number 20040183556
- Publication date Sep 23, 2004
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Application
Fabrication method of semiconductor integrated circuit device and i...
- Publication number 20040135593
- Publication date Jul 15, 2004
- Naoto Ban
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and manufacturing method thereof including a p...
- Publication number 20030203521
- Publication date Oct 30, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Packaging device for holding a plurality of semiconductor devices t...
- Publication number 20030015779
- Publication date Jan 23, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and manufacturing method thereof including a p...
- Publication number 20020182796
- Publication date Dec 5, 2002
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Method of testing memory device, method of manufacturing memory dev...
- Publication number 20020046374
- Publication date Apr 18, 2002
- Hideyuki Aoki
- G11 - INFORMATION STORAGE
Information Patent Application
Fabrication method of semiconductor integrated circuit device and i...
- Publication number 20020039802
- Publication date Apr 4, 2002
- Naoto Ban
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Fabrication method of semiconductor integrated circuit device

Method and apparatus for testing a memory device in quasi-operating...

Fabrication method of semiconductor integrated circuit device

Fabrication method of semiconductor integrated circuit device

Fabrication method of semiconductor integrated circuit device

Semiconductor device and manufacturing method thereof including a p...

Packaging device for holding a plurality of semiconductor devices t...

Fabrication method of semiconductor integrated circuit device and i...

Semiconductor device and manufacturing method thereof including a p...

Method for producing semiconductor device and apparatus usable therein

Semiconductor device and manufacturing method thereof including a p...

Interface unit for a tester and method of connecting a tester with...

Semiconductor device and manufacturing method thereof including a p...

IC testing apparatus and method

Patents Applicationslast 30 patents

FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

Method and apparatus for testing a memory device in quasi-operating...

Fabrication method of semiconductor integrated circuit device

Fabrication method of semiconductor integrated circuit device

Fabrication method of semiconductor integrated circuit device and i...

Semiconductor device and manufacturing method thereof including a p...

Packaging device for holding a plurality of semiconductor devices t...

Semiconductor device and manufacturing method thereof including a p...

Method of testing memory device, method of manufacturing memory dev...

Fabrication method of semiconductor integrated circuit device and i...