Yuji WAKAMIYA

Person

Kobe-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of transporting rack and sample measurement system
- Patent number 12,306,200
- Issue date May 20, 2025
- Sysmex Corporation
- Kouichi Masutani
- G01 - MEASURING TESTING
Information Patent Grant
Sample measurement system and method of transporting racks
- Patent number 11,953,511
- Issue date Apr 9, 2024
- Sysmex Corporation
- Kouichi Masutani
- G01 - MEASURING TESTING
Information Patent Grant
Display device, sample measurement system, display method and program
- Patent number 11,531,037
- Issue date Dec 20, 2022
- Sysmex Corporation
- Atsushi Kumagai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample analysis system, cleaning liquid preparation apparatus, samp...
- Patent number 10,830,783
- Issue date Nov 10, 2020
- Sysmex Corporation
- Ryuki Takagi
- G01 - MEASURING TESTING
Information Patent Grant
Position adjustment method for movable unit in sample analyzer, and...
- Patent number 10,514,376
- Issue date Dec 24, 2019
- SYSMEX CORPORATION
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Grant
Specimen analyzer and specimen analyzing method
- Patent number 10,302,666
- Issue date May 28, 2019
- Sysmex Corporation
- Yuji Wakamiya
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Sample analyzer and a sample analyzing method
- Patent number 9,915,594
- Issue date Mar 13, 2018
- Sysmex Corporation
- Masaki Shiba
- G01 - MEASURING TESTING
Information Patent Grant
Specimen analyzer and specimen analyzing method
- Patent number 9,606,133
- Issue date Mar 28, 2017
- Sysmex Corporation
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and method for controlling sample analyzer
- Patent number 9,581,608
- Issue date Feb 28, 2017
- Sysmex Corporation
- Makoto Ueda
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer
- Patent number 9,304,140
- Issue date Apr 5, 2016
- Sysmex Corporation
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and reagent management method
- Patent number 9,201,083
- Issue date Dec 1, 2015
- Sysmex Corporation
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and a sample analyzing method
- Patent number 9,151,703
- Issue date Oct 6, 2015
- Sysmex Corporation
- Masaki Shiba
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and storage medium
- Patent number 8,871,147
- Issue date Oct 28, 2014
- Sysmex Corporation
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Grant
Specimen analyzer, abnormality control method of the same and compu...
- Patent number 8,778,268
- Issue date Jul 15, 2014
- Sysmex Corporation
- Hisato Takehara
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer
- Patent number 8,535,607
- Issue date Sep 17, 2013
- Sysmex Corporation
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and reagent information writing method
- Patent number 8,430,321
- Issue date Apr 30, 2013
- Sysmex Corporation
- Kazutoshi Tokunaga
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer
- Patent number 8,425,839
- Issue date Apr 23, 2013
- Sysmex Corporation
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and sample analyzing method
- Patent number 8,366,998
- Issue date Feb 5, 2013
- Sysmex Corporation
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and error information displaying method
- Patent number 8,335,662
- Issue date Dec 18, 2012
- Sysmex Corporation
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and method for analyzing samples
- Patent number 8,329,103
- Issue date Dec 11, 2012
- Sysmex Corporation
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzing apparatus
- Patent number 8,279,715
- Issue date Oct 2, 2012
- Sysmex Corporation
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer
- Patent number 8,231,830
- Issue date Jul 31, 2012
- Sysmex Corporation
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and sample analyzing method
- Patent number 8,071,029
- Issue date Dec 6, 2011
- Sysmex Corporation
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzing apparatus
- Patent number 8,040,757
- Issue date Oct 18, 2011
- Sysmex Corporation
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer and method of restarting sample measurement
- Patent number 7,957,935
- Issue date Jun 7, 2011
- Sysmex Corporation
- Tomoyuki Nishida
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and error information displaying method
- Patent number 7,707,010
- Issue date Apr 27, 2010
- Sysmex Corporation
- Yuji Wakamiya
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CONTROLLING SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANALYS...
- Publication number 20250231207
- Publication date Jul 17, 2025
- SYSMEX CORPORATION
- Yuji WAKAMIYA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD OF TRANSPORTING RACK AND SAMPLE MEASUREMENT SYSTEM
- Publication number 20250208157
- Publication date Jun 26, 2025
- SYSMEX CORPORATION
- Kouichi MASUTANI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
CONTAINER TRANSFER METHOD AND CONTAINER TRANSFER APPARATUS
- Publication number 20230228781
- Publication date Jul 20, 2023
- SYSMEX CORPORATION
- Hidetaka HAYAMA
- G01 - MEASURING TESTING
Information Patent Application
QUALITY CONTROL METHOD OF SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANA...
- Publication number 20220308076
- Publication date Sep 29, 2022
- SYSMEX CORPORATION
- Yuji WAKAMIYA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD FOR CONTROLLING SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANALYS...
- Publication number 20220283196
- Publication date Sep 8, 2022
- SYSMEX CORPORATION
- Yuji WAKAMIYA
- G01 - MEASURING TESTING
Information Patent Application
QUALITY CONTROL METHOD OF SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANA...
- Publication number 20220283194
- Publication date Sep 8, 2022
- SYSMEX CORPORATION
- Yuji WAKAMIYA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS SYSTEM, CLEANING LIQUID PREPARATION APPARATUS, SAMP...
- Publication number 20210018526
- Publication date Jan 21, 2021
- SYSMEX CORPORATION
- Ryuki TAKAGI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TRANSPORTING RACK AND SAMPLE MEASUREMENT SYSTEM
- Publication number 20210011039
- Publication date Jan 14, 2021
- SYSMEX CORPORATION
- Kouichi MASUTANI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE MEASUREMENT SYSTEM AND METHOD OF TRANSPORTING RACKS
- Publication number 20210011040
- Publication date Jan 14, 2021
- SYSMEX CORPORATION
- Kouichi MASUTANI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MEASUREMENT SYSTEM AND METHOD OF TRANSPORTING RACKS
- Publication number 20210011041
- Publication date Jan 14, 2021
- SYSMEX CORPORATION
- Kouichi MASUTANI
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE, SAMPLE MEASUREMENT SYSTEM, DISPLAY METHOD AND PROGRAM
- Publication number 20200408792
- Publication date Dec 31, 2020
- SYSMEX CORPORATION
- Atsushi KUMAGAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING SYSTEM, STORAGE DEVICE, AND RACK STORAGE METHOD
- Publication number 20200408793
- Publication date Dec 31, 2020
- SYSMEX CORPORATION
- Atsushi KUMAGAI
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN ANALYZER AND SPECIMEN ANALYZING METHOD
- Publication number 20170160298
- Publication date Jun 8, 2017
- SYSMEX CORPORATION
- Yuji WAKAMIYA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS SYSTEM, CLEANING LIQUID PREPARATION APPARATUS, SAMP...
- Publication number 20170108524
- Publication date Apr 20, 2017
- SYSMEX CORPORATION
- Ryuki TAKAGI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND A SAMPLE ANALYZING METHOD
- Publication number 20150330878
- Publication date Nov 19, 2015
- Sysmex Corporation
- Masaki SHIBA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND METHOD FOR LOADING REAGENT CONTAINER
- Publication number 20140295562
- Publication date Oct 2, 2014
- SYSMEX CORPORATION
- Yuji WAKAMIYA
- G01 - MEASURING TESTING
Information Patent Application
POSITION ADJUSTMENT METHOD FOR MOVABLE UNIT IN SAMPLE ANALYZER, AND...
- Publication number 20130344622
- Publication date Dec 26, 2013
- Sysmex Coporation
- Yuji WAKAMIYA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND A SAMPLE ANALYZING METHOD
- Publication number 20130189708
- Publication date Jul 25, 2013
- SYSMEX CORPORATION
- Masaki SHIBA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND METHOD FOR CONTROLLING SAMPLE ANALYZER
- Publication number 20130078617
- Publication date Mar 28, 2013
- SYSMEX CORPORATION
- Makoto UEDA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER
- Publication number 20130034466
- Publication date Feb 7, 2013
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND STORAGE MEDIUM
- Publication number 20120275956
- Publication date Nov 1, 2012
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER
- Publication number 20120087830
- Publication date Apr 12, 2012
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZING APPARATUS
- Publication number 20120004742
- Publication date Jan 5, 2012
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND REAGENT INFORMATION WRITING METHOD
- Publication number 20110290890
- Publication date Dec 1, 2011
- Kazutoshi Tokunaga
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN ANALYZER AND SPECIMEN ANALYZING METHOD
- Publication number 20110236981
- Publication date Sep 29, 2011
- SYSMEX CORPORATION
- Yuji WAKAMIYA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND REAGENT MANAGEMENT METHOD
- Publication number 20110223682
- Publication date Sep 15, 2011
- SYSMEX CORPORATION
- Yuji Wakamiya
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND ERROR INFORMATION DISPLAYING METHOD
- Publication number 20100238043
- Publication date Sep 23, 2010
- Sysmex Corporation
- Yuji Wakamiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYZER AND METHOD OF RESTARTING SAMPLE MEASUREMENT
- Publication number 20090292492
- Publication date Nov 26, 2009
- SYSMEX CORPORATION
- Tomoyuki NISHIDA
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER AND MEASUREMENT RESTARTING METHOD
- Publication number 20090220379
- Publication date Sep 3, 2009
- SYSMEX CORPORATION
- Yuji WAKAMIYA
- G01 - MEASURING TESTING
Information Patent Application
Specimen analyzer, abnormality control method of the same and compu...
- Publication number 20090215183
- Publication date Aug 27, 2009
- Sysmex Corporation
- Hisato Takehara
- G01 - MEASURING TESTING

Yuji WAKAMIYA

Person

Patents Grantslast 30 patents

Method of transporting rack and sample measurement system

Sample measurement system and method of transporting racks

Display device, sample measurement system, display method and program

Sample analysis system, cleaning liquid preparation apparatus, samp...

Position adjustment method for movable unit in sample analyzer, and...

Specimen analyzer and specimen analyzing method

Sample analyzer and a sample analyzing method

Specimen analyzer and specimen analyzing method

Sample analyzer and method for controlling sample analyzer

Sample analyzer

Sample analyzer and reagent management method

Sample analyzer and a sample analyzing method

Sample analyzer and storage medium

Specimen analyzer, abnormality control method of the same and compu...

Sample analyzer

Sample analyzer and reagent information writing method

Sample analyzer

Sample analyzer and sample analyzing method

Sample analyzer and error information displaying method

Sample analyzer and method for analyzing samples

Sample analyzing apparatus

Sample analyzer

Sample analyzer and sample analyzing method

Sample analyzing apparatus

Analyzer and method of restarting sample measurement

Sample analyzer and error information displaying method

Patents Applicationslast 30 patents

METHOD FOR CONTROLLING SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANALYS...

METHOD OF TRANSPORTING RACK AND SAMPLE MEASUREMENT SYSTEM

CONTAINER TRANSFER METHOD AND CONTAINER TRANSFER APPARATUS

QUALITY CONTROL METHOD OF SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANA...

METHOD FOR CONTROLLING SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANALYS...

QUALITY CONTROL METHOD OF SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANA...

SAMPLE ANALYSIS SYSTEM, CLEANING LIQUID PREPARATION APPARATUS, SAMP...

METHOD OF TRANSPORTING RACK AND SAMPLE MEASUREMENT SYSTEM

SAMPLE MEASUREMENT SYSTEM AND METHOD OF TRANSPORTING RACKS

SAMPLE MEASUREMENT SYSTEM AND METHOD OF TRANSPORTING RACKS

DISPLAY DEVICE, SAMPLE MEASUREMENT SYSTEM, DISPLAY METHOD AND PROGRAM

TESTING SYSTEM, STORAGE DEVICE, AND RACK STORAGE METHOD

SPECIMEN ANALYZER AND SPECIMEN ANALYZING METHOD

SAMPLE ANALYSIS SYSTEM, CLEANING LIQUID PREPARATION APPARATUS, SAMP...

SAMPLE ANALYZER AND A SAMPLE ANALYZING METHOD

SAMPLE ANALYZER AND METHOD FOR LOADING REAGENT CONTAINER

POSITION ADJUSTMENT METHOD FOR MOVABLE UNIT IN SAMPLE ANALYZER, AND...

SAMPLE ANALYZER AND A SAMPLE ANALYZING METHOD

SAMPLE ANALYZER AND METHOD FOR CONTROLLING SAMPLE ANALYZER

SAMPLE ANALYZER

SAMPLE ANALYZER AND STORAGE MEDIUM

SAMPLE ANALYZER

SAMPLE ANALYZING APPARATUS

SAMPLE ANALYZER AND REAGENT INFORMATION WRITING METHOD

SPECIMEN ANALYZER AND SPECIMEN ANALYZING METHOD

SAMPLE ANALYZER AND REAGENT MANAGEMENT METHOD

SAMPLE ANALYZER AND ERROR INFORMATION DISPLAYING METHOD

ANALYZER AND METHOD OF RESTARTING SAMPLE MEASUREMENT

ANALYZER AND MEASUREMENT RESTARTING METHOD

Specimen analyzer, abnormality control method of the same and compu...