Yuji WATANABE

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Kobe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample measuring system and sample measuring method
- Patent number 11,400,455
- Issue date Aug 2, 2022
- Sysmex Corporation
- Hiroki Kotake
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE MEASURING SYSTEM AND SAMPLE MEASURING METHOD
- Publication number 20190232296
- Publication date Aug 1, 2019
- SYSMEX CORPORATION
- Hiroki KOTAKE
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE MEASURING APPARATUS AND SAMPLE MEASURING METHOD
- Publication number 20190201904
- Publication date Jul 4, 2019
- SYSMEX CORPORATION
- Hironori KATSUMI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL