Yujie Dong

Person

Newark, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Mode selection and defect detection training
- Patent number 11,769,242
- Issue date Sep 26, 2023
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Learnable defect detection for semiconductor applications
- Patent number 11,551,348
- Issue date Jan 10, 2023
- KLA Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Active learning for defect classifier training
- Patent number 10,713,769
- Issue date Jul 14, 2020
- KLA-Tencor Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEEP LEARNING BASED MODE SELECTION FOR INSPECTION
- Publication number 20250020598
- Publication date Jan 16, 2025
- KLA Corporation
- Rajkumar Theagarajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UNSUPERVISED OR SELF-SUPERVISED DEEP LEARNING FOR SEMICONDUCTOR-BAS...
- Publication number 20240013365
- Publication date Jan 11, 2024
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UNSUPERVISED OR SELF-SUPERVISED DEEP LEARNING FOR SEMICONDUCTOR-BAS...
- Publication number 20230260100
- Publication date Aug 17, 2023
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
KNOWLEDGE DISTILLATION FOR SEMICONDUCTOR-BASED APPLICATIONS
- Publication number 20230136110
- Publication date May 4, 2023
- KLA Corporation
- Rajkumar Theagarajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEARNABLE DEFECT DETECTION FOR SEMICONDUCTOR APPLICATIONS
- Publication number 20230118839
- Publication date Apr 20, 2023
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODE SELECTION AND DEFECT DETECTION TRAINING
- Publication number 20210366103
- Publication date Nov 25, 2021
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEARNABLE DEFECT DETECTION FOR SEMICONDUCTOR APPLICATIONS
- Publication number 20200327654
- Publication date Oct 15, 2020
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACTIVE LEARNING FOR DEFECT CLASSIFIER TRAINING
- Publication number 20190370955
- Publication date Dec 5, 2019
- KLA-Tencor Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Mode selection and defect detection training

Learnable defect detection for semiconductor applications

Active learning for defect classifier training

Patents Applicationslast 30 patents

DEEP LEARNING BASED MODE SELECTION FOR INSPECTION

UNSUPERVISED OR SELF-SUPERVISED DEEP LEARNING FOR SEMICONDUCTOR-BAS...

UNSUPERVISED OR SELF-SUPERVISED DEEP LEARNING FOR SEMICONDUCTOR-BAS...

KNOWLEDGE DISTILLATION FOR SEMICONDUCTOR-BASED APPLICATIONS

LEARNABLE DEFECT DETECTION FOR SEMICONDUCTOR APPLICATIONS

MODE SELECTION AND DEFECT DETECTION TRAINING

LEARNABLE DEFECT DETECTION FOR SEMICONDUCTOR APPLICATIONS

ACTIVE LEARNING FOR DEFECT CLASSIFIER TRAINING