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Yujie Zhang
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Lomita, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Navigation satellite wide-lane bias determination and over-range ad...
Patent number
10,564,294
Issue date
Feb 18, 2020
Deere & Company
Liwen L. Dai
G01 - MEASURING TESTING
Information
Patent Grant
Navigation satellite orbit and low latency clock determination with...
Patent number
10,564,293
Issue date
Feb 18, 2020
Deere & Company
Yujie Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Estimation of inter-frequency bias for ambiguity resolution in glob...
Patent number
10,393,882
Issue date
Aug 27, 2019
Deere & Company
Liwen L. Dai
G01 - MEASURING TESTING
Information
Patent Grant
Navigation satellite orbit and clock determination with low latency...
Patent number
10,386,496
Issue date
Aug 20, 2019
Deere & Company
Liwen L. Dai
G01 - MEASURING TESTING
Information
Patent Grant
Navigation satellite wide-lane bias determination system and method
Patent number
10,338,232
Issue date
Jul 2, 2019
Deere & Company
Yujie Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Precise low-latency GNSS satellite clock estimation
Patent number
10,191,157
Issue date
Jan 29, 2019
Deere & Company
Liwen L. Dai
G01 - MEASURING TESTING
Information
Patent Grant
Navigation system and method for resolving integer ambiguities usin...
Patent number
8,659,474
Issue date
Feb 25, 2014
Navcom Technology, Inc.
Liwen L. Dai
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for determining clock corrections
Patent number
8,456,353
Issue date
Jun 4, 2013
Deere & Company
Liwen L. Dai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PRECISE LOW-LATENCY GNSS SATELLITE CLOCK ESTIMATION
Publication number
20170269222
Publication date
Sep 21, 2017
Deere & Company
Liwen L. Dai
G01 - MEASURING TESTING
Information
Patent Application
Navigation Satellite Wide-Lane Bias Determination System and Method
Publication number
20170269223
Publication date
Sep 21, 2017
Deere & Company
Yujie Zhang
G01 - MEASURING TESTING
Information
Patent Application
ESTIMATION OF INTER-FREQUENCY BIAS FOR AMBIGUITY RESOLUTION IN GLOB...
Publication number
20170269227
Publication date
Sep 21, 2017
Deere & Company
Liwen L. Dai
G01 - MEASURING TESTING
Information
Patent Application
Navigation Satellite Wide-Lane Bias Determination and Over-Range Ad...
Publication number
20170269225
Publication date
Sep 21, 2017
Deere & Company
Liwen L. Dai
G01 - MEASURING TESTING
Information
Patent Application
Navigation Satellite Orbit and Low Latency Clock Determination with...
Publication number
20170269224
Publication date
Sep 21, 2017
Deere & Company
Yujie Zhang
G01 - MEASURING TESTING
Information
Patent Application
Navigation Satellite Orbit and Clock Determination with Low Latency...
Publication number
20170269226
Publication date
Sep 21, 2017
Deere & Company
Liwen L. Dai
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DETERMINING CLOCK CORRECTIONS
Publication number
20120182181
Publication date
Jul 19, 2012
Liwen L. Dai
G01 - MEASURING TESTING
Information
Patent Application
Navigation System and Method for Resolving Integer Ambiguities Usin...
Publication number
20120176271
Publication date
Jul 12, 2012
Liwen L. Dai
G01 - MEASURING TESTING