TREA

Yujiro AKUTA

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Sample measuring device
    • Patent number 9,903,965
    • Issue date Feb 27, 2018
    • Hitachi, Ltd.
    • Tomonori Hanaya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample measuring device
    • Patent number 9,903,881
    • Issue date Feb 27, 2018
    • Hitachi, Ltd.
    • Tomonori Hanaya
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

  • Information Patent Application

    SAMPLE MEASURING DEVICE
    • Publication number 20160266160
    • Publication date Sep 15, 2016
    • Hitachi, Ltd
    • Tomonori HANAYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE MEASURING DEVICE
    • Publication number 20160252634
    • Publication date Sep 1, 2016
    • Hitachi, Ltd
    • Tomonori HANAYA
    • G01 - MEASURING TESTING