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Yujiro IKEDA
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Wako-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Nondestructive inspection method and apparatus comprising a neutron...
Patent number
11,841,335
Issue date
Dec 12, 2023
Riken
Yasuo Wakabayashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Non-Destructive Inspection Device
Publication number
20240295511
Publication date
Sep 5, 2024
Riken
Yasuo WAKABAYASHI
G01 - MEASURING TESTING
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Patent Application
CONCENTRATION DETECTION DEVICE AND CONCENTRATION DETECTION METHOD
Publication number
20230152250
Publication date
May 18, 2023
Riken
Yasuo WAKABAYASHI
G01 - MEASURING TESTING
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Patent Application
NONDESTRUCTIVE INSPECTION METHOD AND APPARATUS
Publication number
20210033542
Publication date
Feb 4, 2021
Riken
Yasuo WAKABAYASHI
G01 - MEASURING TESTING