Yukang Feng

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Maplewood, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
Dielectric resonating test contactor and method
- Patent number 12,123,897
- Issue date Oct 22, 2024
- Xcerra Corporation
- James Hattis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coaxial probe
- Patent number 12,111,343
- Issue date Oct 8, 2024
- Xcerra Corporation
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for attenuating and/or terminating RF circuit
- Patent number 11,650,227
- Issue date May 16, 2023
- Xcerra Corporation
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket assembly with waveguide antenna probe
- Patent number 11,391,765
- Issue date Jul 19, 2022
- Xcerra Corporation
- Dongmei Han
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR ATTENUATING AND/OR TERMINATING RF CIRCUIT
- Publication number 20230243869
- Publication date Aug 3, 2023
- XCERRA CORPORATION
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REFLECTIVE AND INTERFERENCE CONTROLLED ABSORPTIVE CONTACTOR
- Publication number 20230024755
- Publication date Jan 26, 2023
- XCERRA CORPORATION
- Yukang Feng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
COAXIAL PROBE
- Publication number 20220043029
- Publication date Feb 10, 2022
- XCERRA CORPORATION
- Yukang Feng
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ATTENUATING AND/OR TERMINATING RF CIRCUIT
- Publication number 20210223285
- Publication date Jul 22, 2021
- XCERRA CORPORATION
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIELECTRIC RESONATING TEST CONTACTOR AND METHOD
- Publication number 20210190821
- Publication date Jun 24, 2021
- XCERRA CORPORATION
- James Hattis
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET ASSEMBLY WITH WAVEGUIDE ANTENNA PROBE
- Publication number 20200256908
- Publication date Aug 13, 2020
- XCERRA CORPORATION
- Dongmei Han
- G01 - MEASURING TESTING