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Yukari Imai

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Scanning probe microscope
    • Patent number 6,745,618
    • Issue date Jun 8, 2004
    • Renesas Technology Corp.
    • Yukari Imai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Scanning probe microscope
    • Patent number 6,545,470
    • Issue date Apr 8, 2003
    • Mitsubishi Denki Kabushiki Kaisha
    • Yukari Imai
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Failure analysis method
    • Publication number 20040103353
    • Publication date May 27, 2004
    • Renesas Technology Corp.
    • Tohru Koyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    Scanning probe microscope
    • Publication number 20030115939
    • Publication date Jun 26, 2003
    • Mitsubishi Denki Kabushiki Kaisha
    • Yukari Imai
    • G01 - MEASURING TESTING
  • Information Patent Application

    Semiconductor device inspecting method using conducting AFM
    • Publication number 20030057988
    • Publication date Mar 27, 2003
    • Mitsubishi Denki Kabushiki Kaisha
    • Hitoshi Maeda
    • G01 - MEASURING TESTING
  • Information Patent Application

    Scanning probe microscope
    • Publication number 20030025498
    • Publication date Feb 6, 2003
    • Mitsubishi Denki Kabushiki Kaisha
    • Yukari Imai
    • B82 - NANO-TECHNOLOGY