Yuki Fujita

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test pattern layout for test photomask and method for evaluating cr...
- Patent number 9,996,000
- Issue date Jun 12, 2018
- International Business Machines Corporation
- Brian N. Caldwell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Test pattern layout for test photomask and method for evaluating cr...
- Patent number 9,989,843
- Issue date Jun 5, 2018
- International Business Machines Corporation
- Brian N. Caldwell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Test pattern layout for test photomask and method for evaluating cr...
- Patent number 9,372,394
- Issue date Jun 21, 2016
- International Business Machines Corporation
- Brian N. Caldwell
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...
- Publication number 20160223902
- Publication date Aug 4, 2016
- International Business Machines Corporation
- Brian N. Caldwell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...
- Publication number 20160224720
- Publication date Aug 4, 2016
- International Business Machines Corporation
- Brian N. Caldwell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...
- Publication number 20150212405
- Publication date Jul 30, 2015
- Toppan Printing Co., Ltd.
- Brian N. Caldwell
- G06 - COMPUTING CALCULATING COUNTING