Yuki Okukawa

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Kawasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Nonvolatile semiconductor memory device and method for resetting th...
- Patent number 8,537,598
- Issue date Sep 17, 2013
- Kabushiki Kaisha Toshiba
- Hiroshi Maejima
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 8,207,613
- Issue date Jun 26, 2012
- Kabushiki Kaisha Toshiba
- Yuki Okukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device and method of resetting the...
- Patent number 8,199,557
- Issue date Jun 12, 2012
- Kabushiki Kaisha Toshiba
- Hiroshi Maejima
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 8,195,993
- Issue date Jun 5, 2012
- Kabushiki Kaisha Toshiba
- Yuki Okukawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 8,006,145
- Issue date Aug 23, 2011
- Kabushiki Kaisha Toshiba
- Yuki Okukawa
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF RESETTING THE...
- Publication number 20120230082
- Publication date Sep 13, 2012
- Kabushiki Kaisha Toshiba
- Hiroshi MAEJIMA
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20110264969
- Publication date Oct 27, 2011
- KABUSHIKI KAISHA TOSHIBA
- Yuki Okukawa
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20100237512
- Publication date Sep 23, 2010
- Kabushiki Kaisha Toshiba
- Yuki OKUKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF RESETTING THE...
- Publication number 20100232207
- Publication date Sep 16, 2010
- Kabushiki Kaisha Toshiba
- Hiroshi MAEJIMA
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20090265591
- Publication date Oct 22, 2009
- Kabushiki Kaisha Toshiba
- Yuki Okukawa
- G01 - MEASURING TESTING