Yuki SAWA

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Matsumoto-city, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of testing semiconductor device
- Patent number 11,029,356
- Issue date Jun 8, 2021
- Fuji Electric Co., Ltd.
- Yuki Sawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240421152
- Publication date Dec 19, 2024
- Fuji Electric Co., Ltd.
- Yuki SAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20230402511
- Publication date Dec 14, 2023
- Fuji Electric Co., Ltd.
- Motoyoshi KUBOUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20230261044
- Publication date Aug 17, 2023
- Fuji Electric Co., Ltd.
- Yuki SAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF TESTING SEMICONDUCTOR DEVICE
- Publication number 20200284835
- Publication date Sep 10, 2020
- Fuji Electric Co., Ltd.
- Yuki SAWA
- H01 - BASIC ELECTRIC ELEMENTS