Yuki WATANABE

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Funabashi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit with self testing and method of te...
- Patent number 11,280,831
- Issue date Mar 22, 2022
- Kabushiki Kaisha Toshiba
- Yuki Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 11,262,403
- Issue date Mar 1, 2022
- Kabushiki Kaisha Toshiba
- Yuki Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit
- Patent number 10,571,513
- Issue date Feb 25, 2020
- Kabushiki Kaisha Toshiba
- Masato Nakazato
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF TESTING SEMICONDUCTO...
- Publication number 20210063484
- Publication date Mar 4, 2021
- Kabushiki Kaisha Toshiba
- Yuki Watanabe
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20210063489
- Publication date Mar 4, 2021
- Kabushiki Kaisha Toshiba
- Yuki Watanabe
- G01 - MEASURING TESTING
Information Patent Application
CIRCUITRY DESIGN METHOD AND STORAGE MEDIUM
- Publication number 20200300914
- Publication date Sep 24, 2020
- Kabushiki Kaisha Toshiba
- Yuki Watanabe
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT
- Publication number 20190293710
- Publication date Sep 26, 2019
- KABUSHIKI KAISHA TOSHIBA
- Masato NAKAZATO
- G01 - MEASURING TESTING