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Yukie TOKIWA
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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Electrochemical measurement device
Patent number
10,018,586
Issue date
Jul 10, 2018
Hitachi High-Technologies Corporation
Shinya Matsuoka
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
8,999,240
Issue date
Apr 7, 2015
Hitachi High-Technologies Corporation
Noriko Maeda
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
8,246,907
Issue date
Aug 21, 2012
Hitachi High-Technologies Corporation
Noriko Maeda
G01 - MEASURING TESTING
Information
Patent Grant
Liquid dispensing method and device
Patent number
7,439,076
Issue date
Oct 21, 2008
Hitachi, Ltd.
Yukie Tokiwa
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
7,384,601
Issue date
Jun 10, 2008
Hitachi High-Technologies Corporation
Shigeki Matsubara
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analysis apparatus, managing apparatus for analysis appar...
Patent number
6,846,457
Issue date
Jan 25, 2005
Hitachi, Ltd.
Yukie Tokiwa
G01 - MEASURING TESTING
Information
Patent Grant
Method for pipetting solution, and a pipetting apparatus using the...
Patent number
6,576,477
Issue date
Jun 10, 2003
Hitachi, Ltd.
Yukie Tokiwa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ELECTROCHEMICAL MEASUREMENT DEVICE
Publication number
20150355140
Publication date
Dec 10, 2015
Hitachi High-Technologies Corporation
Shinya MATSUOKA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20130304425
Publication date
Nov 14, 2013
Hitachi High-Technologies Corporation
Noriko MAEDA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20120282141
Publication date
Nov 8, 2012
Hitachi High-Technologies Corporation
Noriko MAEDA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Automatic analyzer
Publication number
20070053793
Publication date
Mar 8, 2007
Noriko Maeda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Automatic analyzer
Publication number
20050175506
Publication date
Aug 11, 2005
Shigeki Matsubara
G01 - MEASURING TESTING