Yukiharu Uraoka

Person

Ikoma, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Thin film transistor substrate provided with protective film and me...
- Patent number 10,916,661
- Issue date Feb 9, 2021
- Merck Patent GmbH
- Yukiharu Uraoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin film transistor, method for manufacturing same and semiconduct...
- Patent number 10,475,934
- Issue date Nov 12, 2019
- National University Corporation Nara Institute of Science and Technology
- Yukiharu Uraoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fusion protein
- Patent number 9,187,570
- Issue date Nov 17, 2015
- Ajinomoto Co., Ltd.
- Ippei Inoue
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Method of fabricating thin-film transistor
- Patent number 7,901,978
- Issue date Mar 8, 2011
- National University Corporation NARA Institute of Science and Technology
- Yukiharu Uraoka
- C30 - CRYSTAL GROWTH
Information Patent Grant
Semiconductor wafer package, method and apparatus for connecting te...
- Patent number 6,323,663
- Issue date Nov 27, 2001
- Matsushita Electric Industrial Co., Ltd.
- Yoshirou Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer package, method and apparatus for connecting te...
- Patent number 6,005,401
- Issue date Dec 21, 1999
- Matsushita Electric Industrial Co., Ltd.
- Yoshirou Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer package, method and apparatus for connecting te...
- Patent number 5,945,834
- Issue date Aug 31, 1999
- Matsushita Electric Industrial Co., Ltd.
- Yoshirou Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Method of presuming life time of semiconductor device
- Patent number 5,650,336
- Issue date Jul 22, 1997
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- G01 - MEASURING TESTING
Information Patent Grant
Device for and method of evaluating semiconductor integrated circuit
- Patent number 5,598,100
- Issue date Jan 28, 1997
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Device for and method of evaluating semiconductor integrated circuit
- Patent number 5,504,431
- Issue date Apr 2, 1996
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Maeda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
GATE INSULATING FILM FORMING COMPOSITION
- Publication number 20220267639
- Publication date Aug 25, 2022
- Merck Patent GmbH
- Yukiharu URAOKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THIN FILM TRANSISTOR SUBSTRATE PROVIDED WITH PROTECTIVE FILM AND ME...
- Publication number 20190319131
- Publication date Oct 17, 2019
- Yukiharu URAOKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THIN FILM TRANSISTOR, METHOD FOR MANUFACTURING SAME AND SEMICONDUCT...
- Publication number 20190006525
- Publication date Jan 3, 2019
- National University Corporation Nara Institute of Science and Technology
- Yukiharu URAOKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POROUS STRUCTURE BODY AND METHOD FOR PRODUCING THE SAME
- Publication number 20140150855
- Publication date Jun 5, 2014
- AJINOMOTO CO., INC.
- Ippei INOUE
- B82 - NANO-TECHNOLOGY
Information Patent Application
FUSION PROTEIN
- Publication number 20140045247
- Publication date Feb 13, 2014
- AJINOMOTO CO., INC.
- IPPEI INOUE
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
METHOD FOR ELECTROCHEMICALLY DETECTING ANALYTE
- Publication number 20120267258
- Publication date Oct 25, 2012
- Nara Institute of Science and Technology
- Yukiharu URAOKA
- G01 - MEASURING TESTING
Information Patent Application
Method of Fabricating Thin-Film Transistor
- Publication number 20090050880
- Publication date Feb 26, 2009
- National University Corporation Nara Institute of Science and Technology
- Yukiharu Uraoka
- C30 - CRYSTAL GROWTH

Yukiharu Uraoka

Person

Patents Grantslast 30 patents

Thin film transistor substrate provided with protective film and me...

Thin film transistor, method for manufacturing same and semiconduct...

Fusion protein

Method of fabricating thin-film transistor

Semiconductor wafer package, method and apparatus for connecting te...

Semiconductor wafer package, method and apparatus for connecting te...

Semiconductor wafer package, method and apparatus for connecting te...

Method of presuming life time of semiconductor device

Device for and method of evaluating semiconductor integrated circuit

Device for and method of evaluating semiconductor integrated circuit

Patents Applicationslast 30 patents

GATE INSULATING FILM FORMING COMPOSITION

THIN FILM TRANSISTOR SUBSTRATE PROVIDED WITH PROTECTIVE FILM AND ME...

THIN FILM TRANSISTOR, METHOD FOR MANUFACTURING SAME AND SEMICONDUCT...

POROUS STRUCTURE BODY AND METHOD FOR PRODUCING THE SAME

FUSION PROTEIN

METHOD FOR ELECTROCHEMICALLY DETECTING ANALYTE

Method of Fabricating Thin-Film Transistor