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Yukihiko Fukasawa
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Nirasaki City, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Probing method and probing program
Patent number
7,969,172
Issue date
Jun 28, 2011
Tokyo Electron Limited
Hideaki Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Probe device, probe card channel information creation program, and...
Patent number
6,963,208
Issue date
Nov 8, 2005
Tokyo Electron Limited
Yukihiko Fukasawa
G01 - MEASURING TESTING
Information
Patent Grant
Probe method and apparatus for inspecting an object
Patent number
6,111,421
Issue date
Aug 29, 2000
Tokyo Electron Limited
Shigeaki Takahashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PROBING METHOD AND PROBING PROGRAM
Publication number
20100033200
Publication date
Feb 11, 2010
TOKYO ELECTRON LIMITED
Hideaki Tanaka
G01 - MEASURING TESTING
Information
Patent Application
Probe device, probe card channel information creation program, and...
Publication number
20050140380
Publication date
Jun 30, 2005
TOKYO ELECTRON LIMITED
Yukihiko Fukasawa
G01 - MEASURING TESTING