Yukihiro Ozaki

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Nishinomiya, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measuring method and measuring apparatus by light scattering
- Patent number 5,870,188
- Issue date Feb 9, 1999
- Kyoto Dei-ichi, Kagaku Co. Ltd.
- Yukihiro Ozaki
- G01 - MEASURING TESTING
Information Patent Grant
Raman scattered light measuring apparatus
- Patent number 5,754,289
- Issue date May 19, 1998
- Kyoto Dai-Ichi Kagaku Co., Ltd.
- Yukihiro Ozaki
- G01 - MEASURING TESTING