Yukihiro Sato

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Chiba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe scanning device
- Patent number 6,734,426
- Issue date May 11, 2004
- SII NanoTechnology Inc.
- Ryuichi Matsuzaki
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe instrument
- Patent number 6,661,006
- Issue date Dec 9, 2003
- Seiko Instruments Inc.
- Yukihiro Sato
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 6,291,822
- Issue date Sep 18, 2001
- Seiko Instruments Inc.
- Takeshi Umemoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever unit and scanning probe microscope utilizing the cantile...
- Patent number 6,176,122
- Issue date Jan 23, 2001
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe scanning apparatus
- Patent number 6,078,044
- Issue date Jun 20, 2000
- Seiko Instruments Inc.
- Masatoshi Yasutake
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Probe scanning device
- Publication number 20030010928
- Publication date Jan 16, 2003
- Ryuichi Matsuzaki
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning probe instrument
- Publication number 20020005482
- Publication date Jan 17, 2002
- Yukihiro Sato
- B82 - NANO-TECHNOLOGY