Yukihisa Funatsu

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Failure diagnostic apparatus and failure diagnostic method
- Patent number 11,193,974
- Issue date Dec 7, 2021
- Renesas Electronics Corporation
- Yukihisa Funatsu
- G01 - MEASURING TESTING
Information Patent Grant
Fault location estimation device, fault location estimation method,...
- Patent number 8,356,218
- Issue date Jan 15, 2013
- Renesas Electronics Corporation
- Yukihisa Funatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FAILURE DIAGNOSTIC APPARATUS AND FAILURE DIAGNOSTIC METHOD
- Publication number 20210255242
- Publication date Aug 19, 2021
- RENESAS ELECTRONICS CORPORATION
- Yukihisa FUNATSU
- G01 - MEASURING TESTING