Yukihisa WADA

Person

Souraku-gun, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray phase imaging apparatus
- Patent number 11,311,260
- Issue date Apr 26, 2022
- Shimadzu Corporation
- Satoshi Sano
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray imaging device
- Patent number 11,272,894
- Issue date Mar 15, 2022
- Shimadzu Corporation
- Satoshi Sano
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray phase imaging system
- Patent number 11,268,916
- Issue date Mar 8, 2022
- Shimadzu Corporation
- Satoshi Sano
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray phase imaging method
- Patent number 11,179,124
- Issue date Nov 23, 2021
- Shimadzu Corporation
- Satoshi Sano
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray imaging apparatus
- Patent number 11,166,687
- Issue date Nov 9, 2021
- Shimadzu Corporation
- Koichi Tanabe
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray phase contrast imaging apparatus
- Patent number 10,859,512
- Issue date Dec 8, 2020
- Shimadzu Corporation
- Koichi Tanabe
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray phase contrast imaging apparatus
- Patent number 10,772,592
- Issue date Sep 15, 2020
- SHIMADZU CORPORATION
- Satoshi Sano
- G01 - MEASURING TESTING
Information Patent Grant
Radiation phase contrast imaging device
- Patent number 10,729,398
- Issue date Aug 4, 2020
- SHIMADZU CORPORATION
- Satoshi Sano
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method of producing diffraction grating
- Patent number 10,643,760
- Issue date May 5, 2020
- SHIMADZU CORPORATION
- Takahiro Doki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and semiconductor detector, methods for manufa...
- Patent number 10,468,365
- Issue date Nov 5, 2019
- SHIMADZU CORPORATION
- Hiroyuki Kishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor detector
- Patent number 10,254,417
- Issue date Apr 9, 2019
- Shimadzu Corporation
- Satoshi Tokuda
- G01 - MEASURING TESTING
Information Patent Grant
Resin type identification method and resin type identification appa...
- Patent number 9,341,566
- Issue date May 17, 2016
- Mitsubishi Electric Corporation
- Masaru Kinugawa
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method and apparatus for evaluating dielectrophoretic intensity of...
- Patent number 8,313,628
- Issue date Nov 20, 2012
- Shimadzu Corporation
- Yoshio Tsunazawa
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Grant
Apparatus for measuring nanoparticles
- Patent number 8,274,654
- Issue date Sep 25, 2012
- Shimadzu Corporation
- Yukihisa Wada
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device
- Patent number 7,911,610
- Issue date Mar 22, 2011
- Shimadzu Corporation
- Naoji Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device cleaning equipment and electronic device cleaning...
- Patent number 7,824,504
- Issue date Nov 2, 2010
- Panasonic Corporation
- Yukihisa Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical measuring device and method, and nanoparticle measuring met...
- Patent number 7,760,356
- Issue date Jul 20, 2010
- Shimadzu Corporation
- Naoji Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing electronic device
- Patent number 7,267,127
- Issue date Sep 11, 2007
- Matsushita Electric Inductrial Co., Ltd.
- Masayuki Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating semiconductor device
- Patent number 6,830,979
- Issue date Dec 14, 2004
- Matsushita Electric Industrial Co., Ltd.
- Yukihisa Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of cleaning electronic device and method of fabricating the...
- Patent number 6,664,196
- Issue date Dec 16, 2003
- Matsushita Electric Industrial Co., Ltd.
- Yukihisa Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating semiconductor device
- Patent number 6,613,636
- Issue date Sep 2, 2003
- Matsushita Electric Industrial Co., Ltd.
- Yukihisa Wada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
X-RAY PHASE IMAGING SYSTEM
- Publication number 20210364453
- Publication date Nov 25, 2021
- Shimadzu Corporation
- Satoshi SANO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY PHASE IMAGING METHOD
- Publication number 20210161492
- Publication date Jun 3, 2021
- Shimadzu Corporation
- Satoshi SANO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY IMAGING DEVICE
- Publication number 20210137476
- Publication date May 13, 2021
- Shimadzu Corporation
- Satoshi SANO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20210015437
- Publication date Jan 21, 2021
- SHIMADZU CORPORATION
- Koichi TANABE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY PHASE IMAGING APPARATUS
- Publication number 20200337659
- Publication date Oct 29, 2020
- Shimadzu Corporation
- Satoshi SANO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-ray Phase Contrast Imaging Apparatus
- Publication number 20200158662
- Publication date May 21, 2020
- Shimadzu Corporation
- Akira HORIBA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION PHASE CONTRAST IMAGING DEVICE
- Publication number 20190343472
- Publication date Nov 14, 2019
- Shimadzu Corporation
- Satoshi SANO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
RADIATION IMAGING APPARATUS
- Publication number 20190175126
- Publication date Jun 13, 2019
- Shimadzu Corporation
- Koichi TANABE
- G01 - MEASURING TESTING
Information Patent Application
X-ray Phase Contrast Imaging Apparatus
- Publication number 20190167219
- Publication date Jun 6, 2019
- Shimadzu Corporation
- Satoshi SANO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SEMICONDUCTOR DETECTOR
- Publication number 20180329081
- Publication date Nov 15, 2018
- Shimadzu Corporation
- Satoshi TOKUDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DETECTOR, METHODS FOR MANUFA...
- Publication number 20180331060
- Publication date Nov 15, 2018
- Shimadzu Corporation
- Hiroyuki KISHIHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PRODUCING DIFFRACTION GRATING
- Publication number 20180226167
- Publication date Aug 9, 2018
- Shimadzu Corporation
- Takahiro DOKI
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
RESIN TYPE IDENTIFICATION METHOD AND RESIN TYPE IDENTIFICATION APPA...
- Publication number 20140203177
- Publication date Jul 24, 2014
- Shimadzu Corporation
- Masaru Kinugawa
- G01 - MEASURING TESTING
Information Patent Application
FLOW CELL
- Publication number 20140063494
- Publication date Mar 6, 2014
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING NANOPARTICLES
- Publication number 20100177311
- Publication date Jul 15, 2010
- Yukihisa Wada
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EVALUATING DIELECTROPHORETIC INTENSITY OF...
- Publication number 20100012496
- Publication date Jan 21, 2010
- Yoshio Tsunazawa
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE
- Publication number 20090251695
- Publication date Oct 8, 2009
- Naoji Moriya
- G01 - MEASURING TESTING
Information Patent Application
ELECTROPHORESIS METHOD, ELECTROPHORESIS MODULE AND ELECTROPHORESIS...
- Publication number 20080257737
- Publication date Oct 23, 2008
- Shimadzu Corporation
- Yukihisa Wada
- G01 - MEASURING TESTING
Information Patent Application
Optical Measuring Device and Method, and Nanoparticle Measuring Met...
- Publication number 20080192252
- Publication date Aug 14, 2008
- Shimadzu Corporation
- Naoji Moriya
- G01 - MEASURING TESTING
Information Patent Application
Particle diameters measuring method and device
- Publication number 20080049213
- Publication date Feb 28, 2008
- Shimadzu Corporation
- Yukihisa Wada
- G01 - MEASURING TESTING
Information Patent Application
Electronic device cleaning equipment and electronic device cleaning...
- Publication number 20070181163
- Publication date Aug 9, 2007
- Yukihisa Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electronic device cleaning equipment and electronic device cleaning...
- Publication number 20070062559
- Publication date Mar 22, 2007
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Yukihisa Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cleaning apparatus and method for electronic device
- Publication number 20060137712
- Publication date Jun 29, 2006
- Yukihisa Wada
- B08 - CLEANING
Information Patent Application
Method for manufacturing electronic device
- Publication number 20060118516
- Publication date Jun 8, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Masayuki Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for cleaning semiconductor device and method for fabricating...
- Publication number 20030153170
- Publication date Aug 14, 2003
- Matsushita Electric Industrial Co., Ltd.
- Yukihisa Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for fabricating semiconductor device
- Publication number 20030017686
- Publication date Jan 23, 2003
- Matsushita Electric Industrial Co., Ltd.
- Yukihisa Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for fabricating semiconductor device
- Publication number 20020192915
- Publication date Dec 19, 2002
- Matsushita Electric Industrial Co., Ltd.
- Yukihisa Wada
- H01 - BASIC ELECTRIC ELEMENTS

Yukihisa WADA

Person

Patents Grantslast 30 patents

X-ray phase imaging apparatus

X-ray imaging device

X-ray phase imaging system

X-ray phase imaging method

X-ray imaging apparatus

X-ray phase contrast imaging apparatus

X-ray phase contrast imaging apparatus

Radiation phase contrast imaging device

Method of producing diffraction grating

Semiconductor device and semiconductor detector, methods for manufa...

Semiconductor detector

Resin type identification method and resin type identification appa...

Method and apparatus for evaluating dielectrophoretic intensity of...

Apparatus for measuring nanoparticles

Optical measuring device

Electronic device cleaning equipment and electronic device cleaning...

Optical measuring device and method, and nanoparticle measuring met...

Method for manufacturing electronic device

Method for fabricating semiconductor device

Method of cleaning electronic device and method of fabricating the...

Method for fabricating semiconductor device

Patents Applicationslast 30 patents

X-RAY PHASE IMAGING SYSTEM

X-RAY PHASE IMAGING METHOD

X-RAY IMAGING DEVICE

X-RAY IMAGING APPARATUS

X-RAY PHASE IMAGING APPARATUS

X-ray Phase Contrast Imaging Apparatus

RADIATION PHASE CONTRAST IMAGING DEVICE

RADIATION IMAGING APPARATUS

X-ray Phase Contrast Imaging Apparatus

SEMICONDUCTOR DETECTOR

SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DETECTOR, METHODS FOR MANUFA...

METHOD OF PRODUCING DIFFRACTION GRATING

RESIN TYPE IDENTIFICATION METHOD AND RESIN TYPE IDENTIFICATION APPA...

FLOW CELL

APPARATUS FOR MEASURING NANOPARTICLES

METHOD AND APPARATUS FOR EVALUATING DIELECTROPHORETIC INTENSITY OF...

OPTICAL MEASURING DEVICE

ELECTROPHORESIS METHOD, ELECTROPHORESIS MODULE AND ELECTROPHORESIS...

Optical Measuring Device and Method, and Nanoparticle Measuring Met...

Particle diameters measuring method and device

Electronic device cleaning equipment and electronic device cleaning...

Electronic device cleaning equipment and electronic device cleaning...

Cleaning apparatus and method for electronic device

Method for manufacturing electronic device

Method for cleaning semiconductor device and method for fabricating...

Method for fabricating semiconductor device

Method for fabricating semiconductor device