Yukihito Kondo

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Transmission electron microscope
- Patent number 7,683,320
- Issue date Mar 23, 2010
- Jeol Ltd.
- Takumi Sannomiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 6,841,775
- Issue date Jan 11, 2005
- Jeol Ltd.
- Yukihito Kondo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combined electron microscope
- Patent number 6,573,502
- Issue date Jun 3, 2003
- Jeol Ltd.
- Yukihito Kondo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopic system equipt with an electron microscope and a scannin...
- Patent number 6,242,737
- Issue date Jun 5, 2001
- Japan Science and Technology Corporation
- Hideaki Ohnishi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device for replacing electron microscope specimens
- Patent number 5,039,864
- Issue date Aug 13, 1991
- Jeol Ltd.
- Yukihito Kondo
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Transmission electron microscope
- Patent number 5,004,919
- Issue date Apr 2, 1991
- Jeol, Ltd.
- Yukihito Kondo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of displaying diffraction pattern by electron microscope
- Patent number 4,623,783
- Issue date Nov 18, 1986
- Jeol Ltd.
- Yukihito Kondo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Transmission Electron Microscope
- Publication number 20080011949
- Publication date Jan 17, 2008
- JEOL Ltd.
- Takumi Sannomiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope
- Publication number 20040031921
- Publication date Feb 19, 2004
- JEOL Ltd.
- Yukihito Kondo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Combined electron microscope
- Publication number 20020166963
- Publication date Nov 14, 2002
- JEOL Ltd.
- Yukihito Kondo
- H01 - BASIC ELECTRIC ELEMENTS