Yukihito Kondoh

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Two-stage dodecapole aberration corrector for charged-particle beam
- Patent number 9,793,088
- Issue date Oct 17, 2017
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen holder for electron microscope
- Patent number 7,566,884
- Issue date Jul 28, 2009
- Jeol Ltd.
- Shunji Deguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Aberration Corrector and Charged-Particle Beam System Equipped Ther...
- Publication number 20100072387
- Publication date Mar 25, 2010
- JEOL Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Field emission electron gun
- Publication number 20070096838
- Publication date May 3, 2007
- JEOL Ltd.
- Masato Kudoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen holder for electron microscope
- Publication number 20060289784
- Publication date Dec 28, 2006
- JEOL Ltd.
- Shunji Deguchi
- G01 - MEASURING TESTING