Membership
Tour
Register
Log in
Yukiko Ikeda
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method for displaying measurement results from x-ray diffraction me...
Patent number
10,801,976
Issue date
Oct 13, 2020
Rigaku Corporation
Akito Sasaki
G01 - MEASURING TESTING
Information
Patent Grant
Crystalline phase identification method, crystalline phase identifi...
Patent number
10,161,888
Issue date
Dec 25, 2018
Rigaku Corporation
Yukiko Ikeda
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR DISPLAYING MEASUREMENT RESULTS FROM X-RAY DIFFRACTION ME...
Publication number
20190064083
Publication date
Feb 28, 2019
Rigaku Corporation
Akito Sasaki
G01 - MEASURING TESTING
Information
Patent Application
Crystalline Phase Identification Method, Crystalline Phase Identifi...
Publication number
20170343492
Publication date
Nov 30, 2017
Rigaku Corporation
Yukiko Ikeda
G01 - MEASURING TESTING