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Yukimasa Minami
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Chiba-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device
Patent number
10,355,077
Issue date
Jul 16, 2019
ABLIC INC.
Yukimasa Minami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having resistance voltage dividing circuit
Patent number
10,205,031
Issue date
Feb 12, 2019
ABLIC Inc.
Yukimasa Minami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor integrated circuit device
Patent number
9,793,215
Issue date
Oct 17, 2017
SII Semiconductor Corporation
Yukimasa Minami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Flip-chip mounted semiconductor device
Patent number
9,704,771
Issue date
Jul 11, 2017
SII Semiconductor Corporation
Yoichi Mimuro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method of manufacturing the same
Patent number
9,231,101
Issue date
Jan 5, 2016
Seiko Instruments Inc.
Yukimasa Minami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor integrated circuit device
Patent number
8,937,365
Issue date
Jan 20, 2015
Seiko Instruments Inc.
Yukimasa Minami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method of manufacturing the same
Patent number
8,859,369
Issue date
Oct 14, 2014
Seiko Instruments Inc.
Yukimasa Minami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing a semiconductor device
Patent number
8,574,974
Issue date
Nov 5, 2013
Seiko Instruments Inc.
Yukimasa Minami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor integrated circuit device and manufacturing method th...
Patent number
8,324,708
Issue date
Dec 4, 2012
Seiko Instruments Inc.
Yukimasa Minami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Current mirror circuit
Patent number
7,652,525
Issue date
Jan 26, 2010
Seiko Instruments Inc.
Yukimasa Minami
G05 - CONTROLLING REGULATING
Information
Patent Grant
Electronic device
Patent number
7,405,612
Issue date
Jul 29, 2008
Seiko Instruments Inc.
Yukimasa Minami
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for manufacturing semiconductor device
Patent number
7,351,595
Issue date
Apr 1, 2008
Seiko Instruments Inc.
Kazutoshi Ishii
G01 - MEASURING TESTING
Information
Patent Grant
Method for manufacturing semiconductor device
Patent number
7,335,518
Issue date
Feb 26, 2008
Seiko Instruments Inc.
Kazutoshi Ishii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Manufacturing method for a semiconductor device
Patent number
7,192,790
Issue date
Mar 20, 2007
Seiko Instruments Inc.
Kazutoshi Ishii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing semiconductor device
Patent number
7,129,099
Issue date
Oct 31, 2006
Seiko Instruments Inc.
Kazutoshi Ishii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing semiconductor device utilizing monitor wafers
Patent number
7,043,328
Issue date
May 9, 2006
Seiko Instruments Inc.
Kazutoshi Ishii
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE HAVING RESISTANCE VOLTAGE DIVIDING CIRCUIT
Publication number
20180286990
Publication date
Oct 4, 2018
ABLIC Inc.
Yukimasa MINAMI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20180090563
Publication date
Mar 29, 2018
SII Semiconductor Corporation
Yukimasa MINAMI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20160322301
Publication date
Nov 3, 2016
SII Semiconductor Corporation
Yukimasa MINAMI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20160126155
Publication date
May 5, 2016
SEIKO INSTRUMENTS INC.
Yoichi MIMURO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20140374821
Publication date
Dec 25, 2014
Yukimasa Minami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20140091425
Publication date
Apr 3, 2014
Seiko Instruments Inc.
Yukimasa MINAMI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20130221432
Publication date
Aug 29, 2013
Seiko Instruments Inc.
Yukimasa MINAMI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
Publication number
20130171782
Publication date
Jul 4, 2013
Seiko Instruments Inc.
Yukimasa MINAMI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MANUFACTURING METHOD TH...
Publication number
20110073986
Publication date
Mar 31, 2011
Yukimasa Minami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and method of manufacturing the same
Publication number
20090160057
Publication date
Jun 25, 2009
Yukimasa Minami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Current mirror circuit
Publication number
20080224737
Publication date
Sep 18, 2008
Yukimasa Minami
G05 - CONTROLLING REGULATING
Information
Patent Application
Electronic device
Publication number
20070102517
Publication date
May 10, 2007
Yukimasa Minami
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for manufacturing semiconductor device
Publication number
20050142673
Publication date
Jun 30, 2005
Kazutoshi Ishii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for manufacturing semiconductor device
Publication number
20050130332
Publication date
Jun 16, 2005
Kazutoshi Ishii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for manufacturing semiconductor device
Publication number
20050124082
Publication date
Jun 9, 2005
Kazutoshi Ishii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Manufacturing method for a semiconductor device
Publication number
20050124081
Publication date
Jun 9, 2005
Kazutoshi Ishii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for manufacturing semiconductor device
Publication number
20050124083
Publication date
Jun 9, 2005
Kazutoshi Ishii
G01 - MEASURING TESTING