Yukimitsu Sekimori

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Patents Grantslast 30 patents

Information Patent Grant
Diaphragm seal and maintenance method thereof
- Patent number 11,835,138
- Issue date Dec 5, 2023
- Yokogawa Electric Corporation
- Yukimitsu Sekimori
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Converter and method of manufacturing the same
- Patent number 6,941,812
- Issue date Sep 13, 2005
- Nagano Keiki Co., Ltd.
- Yukimitsu Sekimori
- G01 - MEASURING TESTING
Information Patent Grant
Sensor chip, laminated wafer for sensor chip and manufacturing meth...
- Patent number 6,192,761
- Issue date Feb 27, 2001
- Nagano Keiki Co. Ltd.
- Yukimitsu Sekimori
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic capacitance type transducer
- Patent number 6,097,821
- Issue date Aug 1, 2000
- Nagano Keiki Co., Ltd.
- Seiichi Yokoyama
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electrostatic capacitance type transducer and method for producing...
- Patent number 5,917,264
- Issue date Jun 29, 1999
- Naohiko Maruno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIAPHRAGM SEAL AND MAINTENANCE METHOD THEREOF
- Publication number 20220112954
- Publication date Apr 14, 2022
- YOKOGAWA ELECTRIC CORPORATION
- Yukimitsu Sekimori
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
HERMETIC STRUCTURE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20170367204
- Publication date Dec 21, 2017
- YOKOGAWA ELECTRIC CORPORATION
- Yukimitsu SEKIMORI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Converter and method of manufacturing the same
- Publication number 20040035214
- Publication date Feb 26, 2004
- NAGANO KEIKI CO., LTD.
- Yukimitsu Sekimori
- G01 - MEASURING TESTING