Yukinori Hirose

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Fabrication method for sample to be analyzed
- Patent number 6,826,971
- Issue date Dec 7, 2004
- Renesas Technology Corp.
- Yukinori Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and method of controlling same
- Patent number 6,452,174
- Issue date Sep 17, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Yukinori Hirose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and a process of manufacturing the same
- Patent number 5,780,870
- Issue date Jul 14, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Hitoshi Maeda
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Crystal analyzing apparatus capable of three-dimensional crystal an...
- Publication number 20040188610
- Publication date Sep 30, 2004
- Renesas Technology Corp.
- Yukinori Hirose
- G01 - MEASURING TESTING
Information Patent Application
Fabrication method for sample to be analyzed
- Publication number 20030097888
- Publication date May 29, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Yukinori Hirose
- G01 - MEASURING TESTING