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Yukio Eda

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Patents Grantslast 30 patents

  • Information Patent Grant

    Laser processing device
    • Patent number 8,022,332
    • Issue date Sep 20, 2011
    • Olympus Corporation
    • Yukio Eda
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Light source apparatus and microscope apparatus
    • Patent number 7,764,424
    • Issue date Jul 27, 2010
    • Olympus Corporation
    • Masato Yabe
    • G02 - OPTICS
  • Information Patent Grant

    Lens evaluation device
    • Patent number 7,747,101
    • Issue date Jun 29, 2010
    • Olympus Corporation
    • Toshiaki Matsuzawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Laser condensing optical system
    • Patent number 7,439,477
    • Issue date Oct 21, 2008
    • Olympus Corporation
    • Yukio Eda
    • G02 - OPTICS
  • Information Patent Grant

    Laser processing device
    • Patent number 7,333,255
    • Issue date Feb 19, 2008
    • Olympus Corporation
    • Yukio Eda
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Confocal microscope
    • Patent number 6,778,323
    • Issue date Aug 17, 2004
    • Olympus Optical Co., Ltd.
    • Tomio Endo
    • G02 - OPTICS
  • Information Patent Grant

    Confocal microscope and height measurement method using the same
    • Patent number 6,580,518
    • Issue date Jun 17, 2003
    • Olympus Optical Co., Ltd.
    • Yukio Eda
    • G02 - OPTICS
  • Information Patent Grant

    Confocal microscope
    • Patent number 6,426,835
    • Issue date Jul 30, 2002
    • Olympus Optical Co., Ltd.
    • Tomio Endo
    • G02 - OPTICS
  • Information Patent Grant

    Wavelength stabilizing apparatus
    • Patent number 5,438,579
    • Issue date Aug 1, 1995
    • Olympus Optical Co., Ltd.
    • Yukio Eda
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Surveying instrument
    • Patent number 5,216,480
    • Issue date Jun 1, 1993
    • Asahi Kogaku Kogyo K.K.
    • Atsumi Kaneko
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    LASER PROCESSING DEVICE
    • Publication number 20080029497
    • Publication date Feb 7, 2008
    • OLYMPUS CORPORATION
    • Yukio Eda
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    Light source apparatus and microscope apparatus
    • Publication number 20070274634
    • Publication date Nov 29, 2007
    • Masato Yabe
    • G02 - OPTICS
  • Information Patent Application

    Lens evaluation device
    • Publication number 20070115457
    • Publication date May 24, 2007
    • OLYMPUS CORPORATION
    • Toshiaki Matsuzawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    Laser condensing optical system
    • Publication number 20060291039
    • Publication date Dec 28, 2006
    • Yukio Eda
    • G02 - OPTICS
  • Information Patent Application

    Laser processing device
    • Publication number 20060228095
    • Publication date Oct 12, 2006
    • OLYMPUS CORPORATION
    • Yukio Eda
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    Automatic focusing method
    • Publication number 20040149883
    • Publication date Aug 5, 2004
    • Olympus Optical Co., Ltd.
    • Yukio Eda
    • G02 - OPTICS
  • Information Patent Application

    Confocal microscope and height measurement method using the same
    • Publication number 20020167723
    • Publication date Nov 14, 2002
    • Olympus Optical Co., Ltd.
    • Yukio Eda
    • G02 - OPTICS
  • Information Patent Application

    Confocal microscope
    • Publication number 20020097490
    • Publication date Jul 25, 2002
    • Olympus Optical Co., Ltd.
    • Tomio Endo
    • G02 - OPTICS