Yukio Imada

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Configuration measuring apparatus and method
- Patent number 6,934,036
- Issue date Aug 23, 2005
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring thickness variation of a thin sh...
- Patent number 6,480,286
- Issue date Nov 12, 2002
- Matsushita Electric Inudstrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus and method
- Patent number 6,026,583
- Issue date Feb 22, 2000
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Configuration measuring apparatus and method
- Publication number 20020196449
- Publication date Dec 26, 2002
- Keishi Kubo
- G01 - MEASURING TESTING