Yukio Kanno

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device testing apparatus
- Patent number 6,104,204
- Issue date Aug 15, 2000
- Advantest Corporation
- Hisao Hayama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus
- Patent number 5,969,537
- Issue date Oct 19, 1999
- Advantest Corporation
- Yukio Kanno
- G01 - MEASURING TESTING
Information Patent Grant
Pick and place apparatus for transferring objects
- Patent number 5,961,168
- Issue date Oct 5, 1999
- Advantest Corp.
- Yukio Kanno
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Semiconductor device transport system with deformed tray compensation
- Patent number 5,812,409
- Issue date Sep 22, 1998
- Advantest Corporation
- Yukio Kanno
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR