Yukio Kenbou

Person

Ibaraki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 9,551,670
- Issue date Jan 24, 2017
- Hitachi, Ltd.
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 8,729,514
- Issue date May 20, 2014
- Hitachi High-Technologies Corporaation
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 7,952,085
- Issue date May 31, 2011
- Hitachi, Ltd.
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 7,417,244
- Issue date Aug 26, 2008
- Hitachi, Ltd.
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Probe manufacturing method, probe, and scanning probe microscope
- Patent number 7,388,199
- Issue date Jun 17, 2008
- Hitachi Kenki Fine Tech Co., Ltd.
- Takafumi Morimoto
- G01 - MEASURING TESTING
Information Patent Grant
Scanning type probe microscope and probe moving control method ther...
- Patent number 7,350,404
- Issue date Apr 1, 2008
- Hitachi Kenki Fine Tech Co., Ltd.
- Tooru Kurenuma
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and measurement method using the same
- Patent number 7,333,191
- Issue date Feb 19, 2008
- Hitachi Kenki FineTech. Co., Ltd.
- Ken Murayama
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 7,242,016
- Issue date Jul 10, 2007
- Hitachi, Ltd.
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus and method thereof
- Patent number 6,894,302
- Issue date May 17, 2005
- Hitachi, Ltd.
- Ichiro Ishimaru
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SURFACE INSPECTION APPARATUS AND METHOD THEREOF
- Publication number 20140218723
- Publication date Aug 7, 2014
- Hitachi High-Technologies Corporation
- Ichiro ISHIMARU
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS AND METHOD THEREOF
- Publication number 20120069329
- Publication date Mar 22, 2012
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS AND METHOD THEREOF
- Publication number 20090103078
- Publication date Apr 23, 2009
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Application
Method of Control of Probe Scan and Apparatus for Controlling Probe...
- Publication number 20080236259
- Publication date Oct 2, 2008
- Tooru Kurenuma
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus and method thereof
- Publication number 20070121108
- Publication date May 31, 2007
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Application
Scanning type probe microscope and probe moving control method ther...
- Publication number 20060284083
- Publication date Dec 21, 2006
- Tooru Kurenuma
- G01 - MEASURING TESTING
Information Patent Application
Probe manufacturing method, probe, and scanning probe microsope
- Publication number 20060284084
- Publication date Dec 21, 2006
- Takafumi Morimoto
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus and method thereof
- Publication number 20050185172
- Publication date Aug 25, 2005
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and measurement method using the same
- Publication number 20050012936
- Publication date Jan 20, 2005
- Ken Murayama
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus and method thereof
- Publication number 20010030296
- Publication date Oct 18, 2001
- Ichiro Ishimaru
- G01 - MEASURING TESTING

Yukio Kenbou

Person

Patents Grantslast 30 patents

Surface inspection apparatus and method thereof

Surface inspection apparatus and method thereof

Surface inspection apparatus and method thereof

Surface inspection apparatus and method thereof

Probe manufacturing method, probe, and scanning probe microscope

Scanning type probe microscope and probe moving control method ther...

Scanning probe microscope and measurement method using the same

Surface inspection apparatus and method thereof

Surface inspection apparatus and method thereof

Patents Applicationslast 30 patents

SURFACE INSPECTION APPARATUS AND METHOD THEREOF

SURFACE INSPECTION APPARATUS AND METHOD THEREOF

SURFACE INSPECTION APPARATUS AND METHOD THEREOF

Method of Control of Probe Scan and Apparatus for Controlling Probe...

Surface inspection apparatus and method thereof

Scanning type probe microscope and probe moving control method ther...

Probe manufacturing method, probe, and scanning probe microsope

Surface inspection apparatus and method thereof

Scanning probe microscope and measurement method using the same

Surface inspection apparatus and method thereof