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Yukio KUMAMOTO
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Kyoto, JP
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last 30 patents
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Patent Grant
Probe, inspection jig, inspection device, and method for manufactur...
Patent number
11,454,650
Issue date
Sep 27, 2022
Nidec-Read Corporation
Hidekazu Yamazaki
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
PROBE, INSPECTION JIG, INSPECTION DEVICE, AND METHOD FOR MANUFACTUR...
Publication number
20210132112
Publication date
May 6, 2021
Hidekazu YAMAZAKI
G01 - MEASURING TESTING