Yukio Ohta

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing semiconductor element
- Patent number 5,905,384
- Issue date May 18, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Akira Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device and fabricating thereof
- Patent number 5,786,627
- Issue date Jul 28, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Akira Inoue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tab tape and semiconductor chip mounted on tab tape
- Patent number 5,767,569
- Issue date Jun 16, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Yukio Ohta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device
- Patent number 5,675,184
- Issue date Oct 7, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Hiroto Matsubayashi
- H03 - BASIC ELECTRONIC CIRCUITRY