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Yukio OTA
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Kamiina-gun, JP
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last 30 patents
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Patent Grant
Inspection probe and an IC socket with the same
Patent number
9,588,140
Issue date
Mar 7, 2017
Yamaichi Electronics Co., Ltd.
Katsumi Suzuki
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
INSPECTION PROBE AND AN IC SOCKET WITH THE SAME
Publication number
20140253163
Publication date
Sep 11, 2014
Katsumi SUZUKI
G01 - MEASURING TESTING