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Yukitaka Shimizu
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Yokohama-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Multi charged particle beam writing apparatus and adjusting method...
Patent number
10,541,105
Issue date
Jan 21, 2020
NuFlare Technology, Inc.
Eita Fujisaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi charged particle beam writing apparatus and multi charged par...
Patent number
10,504,696
Issue date
Dec 10, 2019
NuFlare Technology, Inc.
Osamu Iizuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi charged particle beam writing apparatus and multi charged par...
Patent number
10,497,539
Issue date
Dec 3, 2019
NuFlare Technology, Inc.
Osamu Iizuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi charged particle beam writing apparatus and multi charged par...
Patent number
10,483,088
Issue date
Nov 19, 2019
NuFlare Technology, Inc.
Osamu Iizuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for measuring resolution of charged particle beam and charge...
Patent number
10,211,027
Issue date
Feb 19, 2019
NuFlare Technology, Inc.
Yukitaka Shimizu
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Multi charged particle beam writing apparatus and method of adjusti...
Patent number
10,157,723
Issue date
Dec 18, 2018
NuFlare Technology, Inc.
Tsubasa Nanao
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MULTI CHARGED PARTICLE BEAM WRITING APPARATUS AND ADJUSTING METHOD...
Publication number
20180247788
Publication date
Aug 30, 2018
NuFlare Technology, Inc.
Eita FUJISAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI CHARGED PARTICLE BEAM WRITING APPARATUS AND MULTI CHARGED PAR...
Publication number
20180144905
Publication date
May 24, 2018
NuFlare Technology, Inc.
Osamu IIZUKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI CHARGED PARTICLE BEAM WRITING APPARATUS AND MULTI CHARGED PAR...
Publication number
20180138012
Publication date
May 17, 2018
NuFlare Technology, Inc.
Osamu IIZUKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI CHARGED PARTICLE BEAM WRITING APPARATUS AND MULTI CHARGED PAR...
Publication number
20180138013
Publication date
May 17, 2018
NuFlare Technology, Inc.
Osamu IIZUKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI CHARGED PARTICLE BEAM WRITING APPARATUS AND METHOD OF ADJUSTI...
Publication number
20180040453
Publication date
Feb 8, 2018
NuFlare Technology, Inc.
Tsubasa NANAO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR MEASURING RESOLUTION OF CHARGED PARTICLE BEAM AND CHARGE...
Publication number
20180040456
Publication date
Feb 8, 2018
NuFlare Technology, Inc.
Yukitaka SHIMIZU
G01 - MEASURING TESTING