Yukito NAKAMURA

Person

Saitama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Detection chip, detection system, and detection method
- Patent number 11,408,817
- Issue date Aug 9, 2022
- Otsuka Pharmaceutical Co., Ltd.
- Tomonori Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
Diffracted light removal slit and optical sample detection system u...
- Patent number 11,169,090
- Issue date Nov 9, 2021
- Konica Minolta, Inc.
- Yukito Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Position detection method and position detection device for sensor...
- Patent number 10,976,250
- Issue date Apr 13, 2021
- Konica Minolta, Inc.
- Yukito Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Surface plasmon-enhanced fluorescence measurement device and surfac...
- Patent number 10,690,596
- Issue date Jun 23, 2020
- Konica Minolta, Inc.
- Yukito Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing sensing chip and sensing chip
- Patent number 10,677,731
- Issue date Jun 9, 2020
- Konica Minolta, Inc.
- Yukito Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Surface plasmon enhanced fluorescence measurement device and surfac...
- Patent number 10,495,575
- Issue date Dec 3, 2019
- Konica Minolta, Inc.
- Yukito Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Surface plasmon resonance fluorescence analysis device and surface...
- Patent number 10,451,555
- Issue date Oct 22, 2019
- Konica Minolta, Inc.
- Hideyuki Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Detection chip and detection method
- Patent number 10,254,228
- Issue date Apr 9, 2019
- Konica Minolta, Inc.
- Kosuke Nagae
- G01 - MEASURING TESTING
Information Patent Grant
Surface plasmon-enhanced fluorescence measuring apparatus
- Patent number 9,255,883
- Issue date Feb 9, 2016
- Konica Minolta, Inc.
- Masataka Matsuo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION CHIP, DETECTION SYSTEM, AND DETECTION METHOD
- Publication number 20210356386
- Publication date Nov 18, 2021
- Tomonori KANEKO
- G01 - MEASURING TESTING
Information Patent Application
DIFFRACTED LIGHT REMOVAL SLIT AND OPTICAL SAMPLE DETECTION SYSTEM U...
- Publication number 20200319104
- Publication date Oct 8, 2020
- Konica Minolta, Inc.
- Yukito NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING SENSING CHIP AND SENSING CHIP
- Publication number 20200256796
- Publication date Aug 13, 2020
- Konica Minolta, Inc.
- Yukito NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE
- Publication number 20200150035
- Publication date May 14, 2020
- Konica Minolta, Inc.
- Hidetaka NINOMIYA
- G01 - MEASURING TESTING
Information Patent Application
Surface Plasmon Resonance Fluorescence Analysis Device And Surface...
- Publication number 20200003688
- Publication date Jan 2, 2020
- Konica Minolta, Inc.
- Hideyuki FUJII
- G01 - MEASURING TESTING
Information Patent Application
POSITION DETECTION METHOD AND POSITION DETECTION DEVICE FOR SENSOR...
- Publication number 20190360934
- Publication date Nov 28, 2019
- Konica Minolta, Inc.
- Yukito NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
Detection Chip and Detection Method
- Publication number 20180266954
- Publication date Sep 20, 2018
- Konica Minolta, Inc.
- Kosuke Nagae
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING SENSING CHIP AND SENSING CHIP
- Publication number 20180080872
- Publication date Mar 22, 2018
- KONICA MINOLTA, INC.
- Yukito NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
Surface Plasmon-Enhanced Fluorescence Measurement Device And Surfac...
- Publication number 20180017493
- Publication date Jan 18, 2018
- Konica Minolta, Inc.
- Yukito Nakamura
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PLASMON ENHANCED FLUORESCENCE MEASUREMENT DEVICE AND SURFAC...
- Publication number 20170030833
- Publication date Feb 2, 2017
- Yukito NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
Surface Plasmon Resonance Fluorescence Analysis Device and Surface...
- Publication number 20160356717
- Publication date Dec 8, 2016
- Konica Minolta, Inc.
- Hideyuki FUJII
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PLASMON-ENHANCED FLUORESCENCE MEASURING APPARATUS
- Publication number 20120201716
- Publication date Aug 9, 2012
- Konica Minolta Holdings, Inc.
- Masataka Matsuo
- G02 - OPTICS

Yukito NAKAMURA

Person

Patents Grantslast 30 patents

Detection chip, detection system, and detection method

Diffracted light removal slit and optical sample detection system u...

Position detection method and position detection device for sensor...

Surface plasmon-enhanced fluorescence measurement device and surfac...

Method of manufacturing sensing chip and sensing chip

Surface plasmon enhanced fluorescence measurement device and surfac...

Surface plasmon resonance fluorescence analysis device and surface...

Detection chip and detection method

Surface plasmon-enhanced fluorescence measuring apparatus

Patents Applicationslast 30 patents

DETECTION CHIP, DETECTION SYSTEM, AND DETECTION METHOD

DIFFRACTED LIGHT REMOVAL SLIT AND OPTICAL SAMPLE DETECTION SYSTEM U...

METHOD OF MANUFACTURING SENSING CHIP AND SENSING CHIP

MEASUREMENT DEVICE

Surface Plasmon Resonance Fluorescence Analysis Device And Surface...

POSITION DETECTION METHOD AND POSITION DETECTION DEVICE FOR SENSOR...

Detection Chip and Detection Method

METHOD OF MANUFACTURING SENSING CHIP AND SENSING CHIP

Surface Plasmon-Enhanced Fluorescence Measurement Device And Surfac...

SURFACE PLASMON ENHANCED FLUORESCENCE MEASUREMENT DEVICE AND SURFAC...

Surface Plasmon Resonance Fluorescence Analysis Device and Surface...

SURFACE PLASMON-ENHANCED FLUORESCENCE MEASURING APPARATUS