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Yukitoshi KANAYAMA
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Yokohama-shi, Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Electromagnetic wave detection apparatus, program, and information...
Patent number
12,196,890
Issue date
Jan 14, 2025
Kyocera Corporation
Hiroki Okada
G01 - MEASURING TESTING
Information
Patent Grant
Object detection apparatus and object detection system
Patent number
11,846,698
Issue date
Dec 19, 2023
Kyocera Corporation
Masamitsu Nishikido
G08 - SIGNALLING
Information
Patent Grant
Electromagnetic wave detection apparatus, program, and information...
Patent number
11,835,653
Issue date
Dec 5, 2023
Kyocera Corporation
Hiroki Okada
G02 - OPTICS
Information
Patent Grant
Electromagnetic wave detection apparatus, program, and information...
Patent number
11,796,641
Issue date
Oct 24, 2023
Kyocera Corporation
Hiroki Okada
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic wave detection apparatus, program, and electromagne...
Patent number
11,754,678
Issue date
Sep 12, 2023
Kyocera Corporation
Hiroki Okada
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic wave detection apparatus, program, and electromagne...
Patent number
11,675,052
Issue date
Jun 13, 2023
Kyocera Corporation
Hiroki Okada
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic wave detection apparatus, program, and electromagne...
Patent number
11,573,301
Issue date
Feb 7, 2023
Kyocera Corporation
Hiroki Okada
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic wave detection apparatus, program, and electromagne...
Patent number
11,408,982
Issue date
Aug 9, 2022
Kyocera Corporation
Hiroki Okada
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic wave detection apparatus, program, and electromagne...
Patent number
11,194,021
Issue date
Dec 7, 2021
Kyocera Corporation
Hiroki Okada
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ELECTROMAGNETIC WAVE DETECTION APPARATUS, PROGRAM, AND INFORMATION...
Publication number
20240012114
Publication date
Jan 11, 2024
Kyocera Corporation
Hiroki OKADA
G01 - MEASURING TESTING
Information
Patent Application
OBJECT DETECTION APPARATUS AND OBJECT DETECTION SYSTEM
Publication number
20210041551
Publication date
Feb 11, 2021
Kyocera Corporation
Masamitsu NISHIKIDO
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC WAVE DETECTION APPARATUS, PROGRAM, AND ELECTROMAGNE...
Publication number
20200233067
Publication date
Jul 23, 2020
Kyocera Corporation
Hiroki OKADA
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC WAVE DETECTION APPARATUS, PROGRAM, AND ELECTROMAGNE...
Publication number
20200217655
Publication date
Jul 9, 2020
Kyocera Corporation
Hiroki OKADA
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC WAVE DETECTION APPARATUS, PROGRAM, AND ELECTROMAGNE...
Publication number
20200096616
Publication date
Mar 26, 2020
Kyocera Corporation
Hiroki OKADA
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC WAVE DETECTION APPARATUS, PROGRAM, AND ELECTROMAGNE...
Publication number
20200033116
Publication date
Jan 30, 2020
Kyocera Corporation
Hiroki OKADA
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC WAVE DETECTION APPARATUS, PROGRAM, AND ELECTROMAGNE...
Publication number
20200018858
Publication date
Jan 16, 2020
Kyocera Corporation
Hiroki OKADA
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC WAVE DETECTION APPARATUS, PROGRAM, AND INFORMATION...
Publication number
20200003893
Publication date
Jan 2, 2020
Kyocera Corporation
Hiroki OKADA
G02 - OPTICS