Yukitoshi Otani

Person

Koganei, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Imaging apparatus for obtaining image of polarizing film, inspectio...
- Patent number 10,746,664
- Issue date Aug 18, 2020
- Nitto Denko Corporation
- Shunsuke Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Axially symmetric polarization conversion element
- Patent number 9,612,449
- Issue date Apr 4, 2017
- Saitama Medical University
- Toshitaka Wakayama
- G02 - OPTICS
Information Patent Grant
Optical characteristic measuring apparatus and optical characterist...
- Patent number 8,107,075
- Issue date Jan 31, 2012
- Utsunomiya University
- Yukitoshi Otani
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, measuring method, and characteristic measureme...
- Patent number 7,796,257
- Issue date Sep 14, 2010
- National University Corporation Tokyo University of Agriculture and Technology
- Yukitoshi Otani
- G01 - MEASURING TESTING
Information Patent Grant
Surface shape measuring system
- Patent number 6,906,809
- Issue date Jun 14, 2005
- Yamatake Corporation
- Hisatoshi Fujiwara
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring an inner stress state of disk substrate
- Patent number 6,665,059
- Issue date Dec 16, 2003
- Fuji Electric Co., Ltd.
- Toshiyuki Kanno
- G01 - MEASURING TESTING
Information Patent Grant
Optical isolator device having a wider cutoff wavelength band for a...
- Patent number 5,375,009
- Issue date Dec 20, 1994
- Hoya Corporation
- Yukitoshi Otani
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
IMAGING APPARATUS FOR OBTAINING IMAGE OF POLARIZING FILM, INSPECTIO...
- Publication number 20190033226
- Publication date Jan 31, 2019
- Nitto Denko Corporation
- Shunsuke Sasaki
- G02 - OPTICS
Information Patent Application
AXIALLY SYMMETRIC POLARIZATION CONVERSION ELEMENT
- Publication number 20150002934
- Publication date Jan 1, 2015
- SAITAMA MEDICAL UNIVERSITY
- Toshitaka Wakayama
- G02 - OPTICS
Information Patent Application
Optical Characteristic Measuring Apparatus, Optical Characteristic...
- Publication number 20100103417
- Publication date Apr 29, 2010
- Yukitoshi Otani
- G01 - MEASURING TESTING
Information Patent Application
Optical Characteristic Measuring Apparatus and Optical Characterist...
- Publication number 20090213374
- Publication date Aug 27, 2009
- NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY
- Yukitoshi Otani
- G01 - MEASURING TESTING
Information Patent Application
Measuring Apparatus, Measuring Method, and Characteristic Measureme...
- Publication number 20090051916
- Publication date Feb 26, 2009
- NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY
- Yukitoshi Otani
- G01 - MEASURING TESTING
Information Patent Application
Measuring Apparatus and Measuring Method
- Publication number 20090040522
- Publication date Feb 12, 2009
- NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY
- Yukitoshi Otani
- G01 - MEASURING TESTING
Information Patent Application
Optical characteristic measuring apparatus and optical characterist...
- Publication number 20090033936
- Publication date Feb 5, 2009
- NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY AGRICULTURE AND TECHNOLOGY
- Yukitoshi Otani
- G01 - MEASURING TESTING
Information Patent Application
Surface shape measuring system
- Publication number 20030179385
- Publication date Sep 25, 2003
- Hisatoshi Fujiwara
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring inner stress state of disk substrate
- Publication number 20010028451
- Publication date Oct 11, 2001
- Toshiyuki Kanno
- G01 - MEASURING TESTING

Yukitoshi Otani

Person

Patents Grantslast 30 patents

Imaging apparatus for obtaining image of polarizing film, inspectio...

Axially symmetric polarization conversion element

Optical characteristic measuring apparatus and optical characterist...

Measuring apparatus, measuring method, and characteristic measureme...

Surface shape measuring system

Method of measuring an inner stress state of disk substrate

Optical isolator device having a wider cutoff wavelength band for a...

Patents Applicationslast 30 patents

IMAGING APPARATUS FOR OBTAINING IMAGE OF POLARIZING FILM, INSPECTIO...

AXIALLY SYMMETRIC POLARIZATION CONVERSION ELEMENT

Optical Characteristic Measuring Apparatus, Optical Characteristic...

Optical Characteristic Measuring Apparatus and Optical Characterist...

Measuring Apparatus, Measuring Method, and Characteristic Measureme...

Measuring Apparatus and Measuring Method

Optical characteristic measuring apparatus and optical characterist...

Surface shape measuring system

Method of measuring inner stress state of disk substrate