Yukiya Hattori

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Hitachi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for detecting threats
- Patent number 7,260,173
- Issue date Aug 21, 2007
- Hitachi, Ltd.
- Kyoichiro Wakayama
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection apparatus and inspection system using it
- Patent number 6,333,962
- Issue date Dec 25, 2001
- Hitachi, Ltd.
- Hiroshi Kitaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection apparatus and inspection system using it
- Patent number 6,049,586
- Issue date Apr 11, 2000
- Hitachi, Ltd.
- Hiroshi Kitaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection apparatus and inspection system using it
- Patent number 5,933,473
- Issue date Aug 3, 1999
- Hitachi, Ltd.
- Hiroshi Kitaguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for detecting threats
- Publication number 20040101097
- Publication date May 27, 2004
- Kyoichiro Wakayama
- G01 - MEASURING TESTING